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ELES Semiconductor Equipment

Fraz. Pian di Porto – Z.I. Bodoglie,
148/1/z
Todi (PG),  06059

Italy
http://www.eles.com
  • Booth: B1221-1


Welcome to ELES: Zero Defects with RETE for Reliability.

ELES Semiconductor Equipment S.p.A. is an innovative Italian SME specializing in advanced test solutions for microelectronics.
It designs and develops Test Systems and Test Applications for leading global semiconductor players, supporting both reliability laboratories and production plants, with a strong focus on reliability and Zero Defects, especially in Mission Critical and Safety applications.
For this purpose, ELES has developed RETE – Reliability Embedded Test Engineering, a proprietary methodology that integrates functional testing with electrical and thermal stress.
RETE enables the early detection of latent defects, improving product quality, robustness, and reliability from the very early stages of the product lifecycle.

 Products

  • ART520-HPh
    Reliability Test System for High Power Density GPUs, IPUs, AI and Communication Processors (>1000W)...

    • Two-phase liquid cooling technology for very high power density devices (>150W/cm²)
    • Active device temperature control with ±3°C accuracy
    • Hot-spot thermal management for multi-die systems
    • Fast response to prevent thermal runaway and ensure precise thermal control (±3°C)
    • In-situ testing capabilities and extensive data collection to enable effective failure learning
    • Adaptive stress based on real-time calculation of the DUT's equivalent lifetime, to ensure the target mission profile for each device

Categories

202 Other Equipment
  • Heating; Annealing; Curing Equipment - Furnaces; Conveyors; Ovens; Test Chambers; Heat Treating
    • 208 Test Equipment
  • Burn-In Accessory Systems
  • Burn-In Systems
  • Discrete Component Test Systems
  • Environmental Stress Systems - Temperature; Humidity; Pressure; HAST
  • Functional Test Systems
  • Linear Test Systems
  • Logic Test Systems
  • Memory Test Systems
  • Optical Test Systems
  • Package Test Systems
  • Parametric Test Systems
  • System on a Chip (SOC); Mixed Signal Test Systems
    • 309 Test Materials
  • Burn-In Boards; Performance Boards (incl. Low; High Temp and Ceramic)
  • Probe Cards; DUT boards and other probing accessories (incl Ceramic and Special Purpose Probe Cards)
  • Test Sockets; Contactors and Contact accessories
    • 601 Design Software
  • CAD - Computer Automated Design
  • EDA - Electronic Design Automation; Circuit Design
    • 602 Manufacturing Software
  • Test Programs
    • 701 Manufacturing Services or Consulting
  • Equipment; Hardware; Product Design, Integration and Manufacturing

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