RADIATION TECHNOLOGY (Shanghai) CO.,LTD
Welcome to RADIATION TECHNOLOGY (Shanghai) CO.,LTD
After near 20 years of optical detection experience of accumulation, company self-made related application of optical device, for solar industry of crystal silicon and the non-crystal silicon of D8 reflection instrument, and composite machine Taiwan; for high precision of film thick of volume measuring, launched itself development of full spectrum oval partial instrument (SE) and the full spectrum reflection type film thick measurement instrument (SR), and single wavelength oval partial instrument (SWE).
Description of Main product：Spectroscopic Ellipsometer (SE)
Rapid measurement
Precision measuring film thickness and refractive index
Measurement optical consstant of various materials
Wavelength range：300nm~1080nm (Std.)
Multilayers analysis detection
Ellipsometric parameters accuracy ±0.01 for Tan (ψ), ±0.01 for Cos (Δ)
Products