Loading...

JEOL INDIA PRIVATE LIMITED

305 ELEGANCE TOWER JASOLA BUSINESS DISTRICT
NEW DELHI,  DELHI  110025

India
http://www.jeol.com
  • Booth: H6E37


Electron Microscopes, Analytical Instruments, Ion Beam tools

JEOL is the world leader in maaufacturing of Electron Optics & Analytical Instruments since 1949.

Scanning Electron Microscope,  Focused Ion Beam System, Cross Section Polisher, Ion Slicer, X-ray Fluorescence Spectrometer.

Transmission Electron Microscope, Electron Probe Microanalyzer, Auger Micro Probe, Photoelectron Spectrometer.

Nuclear Magnetic Resonance System, Electron Spin Resonance System, Mass Spectrometer,(Time-of-flight mass spectrometer, gas chromatograph mass spectrometer, 

https://www.jeol.com/corporate/outline/profile.php 

www.jeol.com 

 Products

  • Transmission Electron Microscope JEOL JEM-F200
    Transmission Electron Microscope...

    • Transmission Electron Microscope offers superior spatial resolution and element analysis capability for material characterization
  • (SEM) Scanning Electron Microscope JEOL JSM-IT510
    Scanning Electron Microscope...

    • Resolution : 3 nm 

    Magnification : 300000x

    Application : Material Characterization of samples

  • (FESEM) FE - Scanning Electron Microscope (JEOL)
    JEOL FESEM JSM-IT810...

    • Resolution : 0.5 nm 

    Magnification : 10,00000x

    Versatility and high spatial resolution meet automation with the JSM-IT810 series FE-SEM.
    No-coding automation for imaging and EDS analysis is built-in for a streamlined and efficient workflow.
    New functions are available to ensure high quality data and an enhanced user experience for all SEM users.

  • Polisher - Cross Section Polisher (JEOL)
    Cross Section Polisher...

    • CROSS SECTION POLISHER™ (CP) is widely utilized in the fields of electronic parts, ceramics, metal, battery, and polymer. The mechanical high-quality uniform cross section can be easily prepared for complex materials and fragile specimens. 
  • Electron Microscopes (FIB - SEM)
    FIB-SEM...

    • A focused ion beam system is an instrument to mill a specimen using an ion beam at high speed and high precision during observation. It is possible to prepare a specimen for a transmission electron microscope (TEM) by automatic milling and 3D analysis.
    A multi-beam system equipped with a scanning electron microscope (SEM) is capable of a variety of analyses by attaching a detector.

Categories

203 Inspection & Measurement Products
  • Microscopes: SEM; Focused Ion Beam (FIB), TEM
  • Spectrometers; FTIR; ATR-FTIR; Auger Electron (AES); SIMS
    • 208 Test Equipment
  • Failure Analysis Systems
    • 901 Printed, Organic, Flexible and Large Area
  • Equipment: Inspection
  • Equipment: laboratory

    • Send Email

    Type your information and click "Send Email" to send an email to this exhibitor. To return to the previous screen without saving, click "Reset".

    Loading ...

    :
    :


    Legend
    Available Timeslot
    Scheduled Appointment
    Personal Appointments
    Appointment Request
    Blocked Timeslot
    Restricted Timeslot
    Cancelled
    Declined