Bruker India Scientific Pvt Ltd
Bruker Nano Surfaces Metrology Division specializes in providing advanced surface measurement and analysis tools, including atomic force microscopy (AFM), nanomechanical testing, optical & stylus profilometry, nanoIR spectroscopy, ellipsometry and tribology & mechanical testing. We offer a wide range of solutions for semiconductor industry, allowing our users to breakthrough in their field of work. 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation products. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition.
Check out our semiconductor solutions here.