Bruker India Scientific Pvt Ltd
Bruker is proud to showcase two divisions—Nano Surfaces & Metrology and TOFWERK—bringing complementary analytical technologies to advance semiconductor manufacturing.
Bruker Nano Surfaces Metrology Division specializes in providing advanced surface measurement and analysis tools, including atomic force microscopy (AFM), nanomechanical testing, optical & stylus profilometry, nanoIR spectroscopy, ellipsometry and tribology & mechanical testing. We offer a wide range of solutions for semiconductor industry, allowing our users to breakthrough in their field of work. 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation products. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition.
TOFWERK is making the world a cleaner place through innovative solutions for chemical analysis. We design, manufacture, and optimize ultra-sensitive, mobile mass spectrometers to comprehensively characterize the composition and purity of samples and the health of environments. Together, Bruker and TOFWERK offer complementary analytical technologies that support semiconductor manufacturers in advancing process control, characterization, and development. For more information about TOFWERK's semiconductor solutions, please contact our team: Dr. Ramakrishna Ramisetty ([email protected]) or Mr. Sudhir Tyagi ([email protected]).