NEXTIN, Inc.

Gyeonggi-do, Hwaseong-si, 
Korea (South)
http://www.nextinsol.com
  • 小間番号5102


 出展製品

  • AEGIS Wafer Inspection System
    AEGIS Wafer Inspection System, based on NEXTIN’s innovative 2-Dimensional Imaging Technology, is a combo system with dark-field and bright-field inspection capabilities, optimized for 1x nanometer nodes and beyond....

  • AEGIS Wafer Inspection System, based on NEXTIN’s innovative 2-Dimensional Imaging Technology, is a combo system with dark-field and bright-field inspection capabilities, optimized for 1x nanometer nodes and beyond. Dual-Mirror Focal Plane Assembly, NEXTIN’s patented technology, parcels out the lights illuminated from 355nm high-power pulsed-laser into multiple high-performance CMOS sensors, enabling inspection of wide areas simultaneously at the maximum speed per hour.

    With this combo feature, AEGIS Wafer Inspection System can be used for all patterning photo & etch processes and film-related processes like CVD and CMP processes in FEOL (Front-End Of Line) and BEOL (Back-End Of Line).