Semiconductor Test all-in-one Service, MEMPro Corporation.
(1) Cantilever Probe Card using the Probe Needles :
- Probe Needle
- Bending Needle
- Coating Needle
(2) Vertical Probe Card :
- Cobra Needles
(1) Vertical Probe Card :
- Short Needle
(1) Outperforms MEMS :
- PEMS (Use of alloy metal, Superior physical and electrical performance and enables implementation of a variety of Taper shapes)
(1) Fixture Jigs and Vertical Probe Card :
- Wire Probe