Trade Promotion Section of the Italian Embassy - Tokyo

港区,  東京都 
Japan
https://www.ice.it/it
  • 小間番号7315


イタリアの半導体業界の概況について詳しくお知りになりたい方は、SEMICON Japan 2024へ是非お越しください。

イタリア・パビリオンへようこそ

イタリアは欧州の情報通信技術市場における成長とイノベーションのけん引役であり、同市場では半導体が重要な役割を担っています。イタリアの半導体業界のエコシステムについて詳しくお知りになりたい方は、イタリアパビリオンへ(ブース:#7315)是非お越しください。

イタリアは欧州の情報通信技術市場における成長とイノベーションのけん引役であり、同市場では半導体が重要な役割を担っています。

イタリアの半導体業界エコシステムは、半導体製造工場、研究センター、設計開発企業、その他の主要な構成要素で確立されたサプライチェーンに支えられています。

イタリアは、国内外の企業が研究センター、大学、産業クラスター、技術パーク、スタートアップインキュベーターとの力強くダイナミックな相乗効果を活用できるイノベーションのための環境が整っており、半導体産業のさらなる発展に貢献しています。

研究機関、堅固な産業基盤、有利なビジネス環境による広範なネットワークのおかげで、イタリアにはマイクロエレクトロニクスのトップ企業が多数存在しています。

イタリアにおける研究・先端技術コミュニティのさらなる発展は、180億ユーロの復興・回復のための国家計画に支えられています。さまざまな給付金やインセンティブが設定されている中、同計画は有形資産・無形資産、および研究、開発、イノベーション、設計へ投資を行う企業に対して大幅な税額控除を認めています。


 出展製品

  • CREA’s PCI technology
    PCI (Probe Card Interface) technology, patented by CREA, is a high-volume manufacturing test solution Si, SiC, and GaN bare dies, particularly in Known Good Die (KGD) applications....

  • PCI (Probe Card Interface) technology, patented by CREA, is a high-volume manufacturing test solution designed to work seamlessly with the CREA MT tester family.

    This combination enables high-power static, dynamic, and short circuit testing for Si, SiC, and GaN bare dies, particularly in Known Good Die (KGD) applications.

    PCI hardware is highly effective in monitoring the power levels maintained by each probe card needle in real-time, allowing test engineers to predict potential Device Under Test (DUT) failures during the test phase.

    Whenever a device failure is predicted, the PCI can react immediately (within a few hundred nanoseconds) by shutting off the probe card’s power supply, safeguarding the equipment hardware (probe card, instruments) and the DUT.

    This predictive capability is essential when performing short circuit test because a sudden die failure can cause a hard short between the bus links. In such cases, the bare die may melt and fuse with the probe card’s needles, or it could completely disintegrate due to the high surge of energy.

  • SPEA - DOT800T - Power Semiconductor Tester
    DOT800T provides a complete solution for Power testing, combining on a single machine all the resources to perform ISO, AC, DC test on the whole range of power applications, from wafer level to final product test....

  • DOT800T provides a complete solution for Power testing, combining on a single machine all the resources to perform ISO, AC, DC test on the whole range of power applications. This tester is expressly designed to address the test requirements of traditional Silicon devices as well as new Gallium Nitride and Silicon Carbide technologies, covering their performance range with the highest voltage and current source capabilities, high frequency and low current measurement capabilities. The correct device operation is verified under actual working conditions with complete and accurate dynamic tests, static test and isolation test sequences, to guarantee the quality and reliability of every device. All of this, in a high-throughput, modular and configurable tester, designed for mass- production environments. A multi-core architecture allows DOT800T to perform accurate static, dynamic and isolation tests on dedicated stations, each of which with a dedicated independent controller. The different test programs are performed in a true parallel, asynchronous mode, since each test core controller manages test resources, instrument connections, and test program execution.
  • FBK - Fondazione Bruno Kessler
    FBK-SD is a research and innovation centre with unique characteristics in Italy and with only a few similarities internationally....

  • FBK-SD is a research and innovation centre with unique characteristics in Italy and with only a few similarities internationally. Highly integrated sensors and devices, products of excellence in research and industrial innovation, based on MEMS, CMOS, photonics and surface functionalisation techniques and interfaces.

    This comes from the wide base of diverse knowledge and competencies, supported by state-of-the-art research infrastructures, to attain outstanding results in both research and innovation. The ability to design and produce silicon-based devices and to functionalise them with advanced surface treatments, to develop photonics circuits and quantum technologies, to use MEMS techniques and hybridisation methods for combining the performance of the various technologies constitutes a research and development environment rarely found within a single Institute.

  • MICROTEST
    Microtest - Product Information...

  • The complete product catalog is available at the following link: https://drive.google.com/drive/folders/1G2sW8-80AxbkMd3Tlgou6SqOb9EAC0zo