The TSI Nano LPM™ (Liquid Particle Monitor) System delivers true 10 nm nanoparticle detection in ultrapure water (UPW), essential for advanced semiconductor manufacturing.
Using a patented aerosolization technique, UPW is transformed into droplets, dried, and solid particles are isolated. These particles are then measured by a water-based Condensation Particle Counter (CPC), designed for cleanroom compatibility.
The Nano LPM ensures real-time, continuous monitoring of UPW, enabling early detection of contamination events and process anomalies. Engineering and quality teams gain reliable data to support quick, informed decisions. With consistent performance and high sensitivity, the Nano LPM™ sets the standard for UPW particle monitoring in nanometer-scale process environments.