SPEA Automatic Test Equipment

  • Booth: 1400

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Established in 1976, SPEA is a world leading company in the field of automatic test equipment for semiconductors and electronic boards. Product portfolio includes: - Analog Mixed-Signal semiconductor testers - Automated test cells for MEMS devices, combining handling, testing, and physical stimulus (inertial, pressure, humidity, magnetic, acoustic, proximity, UV), for single-function or COMBI MEMS.  All SPEA’s products are entirely developed and manufactured in house, including application engineering.


  • MEMS Test Cells
    SPEA test cells for MEMS devices combine fast pick&place handling, reliable DUT contacting and complete final test capabilities, including electrical test, physical stimulus for functional test and calibration, and tri-temp thermal conditioning. ...

  • All MEMS Test Cell elements are designed and manufactured directly by SPEA. The test cell works as a single equipment, performing test, handling and stimulus operations.

    Main advantages result in:

    • reduced costs, compared to solutions based on components from different suppliers

    • fast time to market

    • ease of use and maintenance, which means low cost of ownership

    • scalability and easy modification/extension of the equipment 

    • High-throughput pick and place test handler (33,000+ UPH), specifically designed to perform gentle, fully automated handling of MEMS devices, without applying extra-force to the component. Components are picked up from trays, bowl feeder, wafer or strip on blue/UV tape,  transferred to the test area and, at the end of the test, are placed on trays, reel or box

    • Stimulus units for testing inertial MEMS, pressure sensors, magnetic and 9-DoF MEMS, proximity sensors, humidity sensors, MEMS microphones, proximity and UV sensors, with possibility of reconfiguration with different stimulus modules

    • Thermal conditioning, with an innovative nitrogen-less system

    More info at: http://www.spea.com/SemiconductorTestAutomation/ProductsbyFunction/MEMSSensorsTestCells/tabid/334/language/it-IT/Default.aspx 

  • Comptest MX Analog Mixed Signal Tester
    Comptest MX test platform addresses the test requirements of all analog mixed signal devices, such as power and discretes, MEMS and sensors, power management ICs and LED drivers, automotive devices, identification ICs and smart card modules. ...

  • Comptest MX is designed to cut  the cost of test at least of 50% (or even more!):  

    • True per-pin architecture achieves 99% parallel test efficiency in multi-site testing

    • Timing for the instrument programming is generated in parallel by multiple, high-frequency CPUs, and it is independent from the PC performance

    • 64-line Synchrobus and 16-line high-speed Synchrobus save test time, providing hardware synchronization between all the instruments

    • 88 slots for analog and mixed-signal instrumentation, and 1408 analog/digital channels, give high multi-site test capabilities 

    • Pattern-based test programming allows saving 30% on the test time

    • ATOS C2 software reduces time to market thanks to fast test program development/debug/characterization

    Real parallel test is performed with programmable logic units per pin, timing measurement units per pin, multiple channel digitizers with DSP instrumentation for fast data computation, arbitrary signal generators for multiple signal generation. 

    More info at: http://www.spea.com/SemiconductorTestAutomation/ProductsbyFunction/AnalogMixedSignalTesters/tabid/371/language/en-US/Default.aspx

  • DOT 100 MEMS Device-Oriented Tester
    DOT 100 is a compact test system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly low cost. DOT 100 can be directly integrated inside SPEA MEMS stimulus, docked to prober/handler, or used as rack. ...

  • The DOT 100 is based on a revolutionary per-device architecture: 

    - each device under test has a dedicated CPU managing the entire test process, in addition to dedicated device power supply and time measurement unit

    - each instrument card hosts all the resources for the parallel test of 3 devices

    All this is contained in a hand-carryable size, which offers a variety of uses:

    - integrated inside SPEA MEMS stimulus, DOT 100 provide direct tester/DUT connection, which results in signal integrity, higher test frequency, zero footprint

    - docking to prober 

    - benchtop unit 

    - rack for soft docking with handlers

    More info at http://www.spea.com/SemiconductorTestAutomation/ProductsbyFunction/MEMSDeviceOrientedTesters/tabid/365/language/en-US/Default.aspx

  • Power Module Test Cell
    SPEA’s Power Module Test Cell is the complete equipment to the production test of IGBT power modules. Tester architecture and instrumentation, in-line automation, contacting, software, are designed, manufactured, supported directly by SPEA. ...

  • SPEA Power Module Test Cells provide a turnkey solution for the automated handling, contacting and testing of IGBT modules, with the capability to force and measure the very high current and voltage  values required for a complete, reliable test:

    • 2 test stations, one for AC and one for DC test

    • DC test capabilities 2500V/1000A

    • AC test capabilities 1000V/800A or 600V/1200A

    • parasitic inductance <60nH: over-voltage is always lower than breakdown

    • Dedicated CPU on HV/HI instruments and local set-up memory, for easier management of parallel function and shorter test time

    • Automatic spike detection to avoid damage on the DUT

    • Embedded alarms  on the instruments

    • Current generators are internally parallelable, while voltage generators are internally stackable: this means no need for hardware on the load board

    • automated in-line handling for all module shapes

    • connection length is minimized to avoid stray inductance: no device damaging or overstressing during testing cycles

    More info at http://www.spea.com/SemiconductorTestAutomation/ProductsbyFunction/PowerModuleTestCells/tabid/346/language/en-US/Default.aspx

  • DOT400 Technology-Oriented Tester
    DOT400 is a revolutionary mixed-signal tester: in a zero-footprint design, with just 3 instruments, it perfectly addresses the test needs of automotive, PMIC, lighting, converter, MEMS applications, offering lowest costs of investment, ownership, test. ...

  • A zero-footprint system: no instrument cabinet, no manipulator. The possibility of a fast and simple reconfiguration, to promptly test different applications according to current production volumes. High density of analog/digital channels per board, to quadruple the test parallelism. Best signal integrity, thanks to dedicated tester interface on each instrument. These are the main features of DOT 400. 

    With this revolutionary tester, 3 powerful instruments are the only resources required to perfectly cover the requirements of most mixed-signal devices.

    The system configuration can be tailored to a defined product, avoiding any useless and costly resource redundancy. Then, if a peak of production of a different product requires a different configuration, any idle system can be easily reconfigured and moved: the reconfiguration is as simple as possible, while the system can be easily moved thanks to its compact dimensions and the manipulator-free docking system.

    More info at http://www.spea.com/SemiconductorTestAutomation/ProductsbyFunction/TechnologyOrientedTesters/tabid/417/language/en-US/Default.aspx

  • 4050 Flying Probe Tester
    4050 Flying Probe Tester is the perfect tool for testing probe cards and load boards, lowering costs while avoiding downtime in production. ...

  • 4050 Flying Probe Tester can deliver important quality and economical benefits to semiconductor industries, demonstrating to be the best machine for testing probe cards and load boards. It can be profitably used to test new probe cards and load boards before placing them in production (so to avoid the diagnostics directly on the mixed signal tester), to trouble shooting on field returns, to check-up for the remaining life of components (to avoid down time during production due to load board failures).

    SPEA 4050 can detect weak components, such as relays, in a very accurate and cost-effective way. Preventive test of components with defined lifetime allows the early identification of the ones that need to be replaced, avoiding their breakdown during production.

    The target of this preventive test - to be run at defined time intervals on production load boards - is to drastically reduce the failure of load boards during production test, with the related costs.

    More info at http://www.spea.com/BoardTestAutomation/ProductsbyFunction/FlyingProbeTestersS2/tabid/384/language/en-US/Default.aspx