HAMAMATSU PHOTONICS K.K.

Hamamatsu,  Shizuoka 
Japan
http://www.hamamatsu.com
  • Booth: D724


Show semiconductor failure analysis systems and technologies

Hamamatsu Photonics K.K. is a leading company to advance photonics technology. We manufacture photomultiplier tubes, imaging tubes, opto-semiconductors, and imaging and analyzing systems in Japan, North America, Europe, and Asia. 

In the SEMICON KOREA 2019, we introduce failure analysis systems and related technologies.

 Press Releases

  • Our prime products in SEMICON KOREA2019 are iPHEMOS-DD and Visible Nanolens.

    iPHEMOS-DD enables your wafer, die or package sample to direct-dock by LSI tester and to run test programs at operation speed for dynamic fault localization. Visible Nanolens is a solid immersion lens for visual light source. Not only photo emission camera, thermal emission camera, OBIRCH and EOP/EOFM, but Visual Nanolens and visual light source are integrated on iPHEMOS-DD, which can cover whole range of fault localization. It can detect from resistive short by thermal camera to wave form delay of single transistor by using Visual EOP.

 Products

  • IPHEMOS-DD
    Inverted Photo Emission microscope for tester direct docking...

    • iPHEMOS-DD enables your wafer, die or package sample to direct-dock by LSI tester and to run test programs at operation speed for dynamic fault localization. Probing pin number can reach more than five thousand pins.

  • Visible Nanolens
    100nm spatial resolution by solid immersion lens...

    • The Nanolens is a hemispherical lens that touches the Si substrate and utilizes the index of refraction of silicon to increase the numerical aperture, which improves spatial resolution and convergence efficiency. The brand new Visible Nanolens is designed for visible light source and it makes possible to reach 100nm spatial resolution.

  • Thermal F1
    Brand new single function platform of Thermal emission microscope....

    • Thermal F1 is brand new single function platform of Thermal emission microscope. High sensitive InSbHS camera and thermal lock in function are included as standard configurations. It can detect thermal emission signals from large PC board to small die level and allow you to shorten TAT by well-designed interface/hardware/software.

  • SOBIRCH
    Pinpoint short defects deep inside PKG devices...

    • Ultra-Sonic Beam Induced Resistance Change (SOBIRCH) is brand new technology and similar technology with OBIRCH. OBIRCH can detect current change by induced laser beam. Instead of laser, ultrasonic beam is used on SOBIRCH. That can allow to detect resistive shorts without removing mold resin of package samples. And it has good special resolution and sensitivity to pinpoint the short signals deep inside package devices.

  • MOCI
    Detect ultra-low resistance shorts and open defects...

    • Magneto Optical Current Imaging (MOCI) is another brand new technology. Polarization of incident polarized light can be rotated in MO crystal by Faraday Effect and polarization of reflect light is detected by detector. That allows to visualize current path. Compared to SQUID microscope, MOCI requires no vacuum nor cooling, just put MO crystal on samples. And it can detect ultra-low resistance shorts and open defects.

  • IR-OBIRCH function 07 amp
    Brand new OBIRCH amplifier with ultra-high sensitivity...

    • IR-OBIRCH function 07 amp is able to detect 1pA current change when Voltage/Current is applied below +/-1V / below +/-1uA for low voltage/current device.

Categories

203 Equipment, Inspection & Measurement
  • Microscopes: Confocal Scanning Microscope; 3-D Video Microscopes
  • Microscopes: Optical Microscopes
  • Overlay Measurement
  • Package Inspection; Lead Scanners
  • Thermal Sensing, Measurement, Analysis
    • 208 Equipment, Test
  • Failure Analysis Systems
  • Functional Test Systems
  • Logic Test Systems
  • Memory Test Systems
  • Package Test Systems
  • Printed Circuit Board; Wire Board (PCB or PWB) Test and Repair
  • Wireless, non-contact Test Systems
    • 401 Sub-systems
  • Cameras - Still; CCD; Video & Monitors


    • Back to the Search
    Loading ...

    :
    :


    Legend
    Available Timeslot
    Scheduled Appointment
    Personal Appointments
    Appointment Request
    Blocked Timeslot
    Restricted Timeslot
    Cancelled
    Declined

    BEWARE - Special Warning Notice about ExpoGuide and FAIRGuide

    With the ongoing solicitations, SEMI would like to continue to alert you with questionable professional practices perpetrated against exhibitors by FairGuide.com (Austria) and Expo Guide (Mexico), Event Fair - The Exhibitors' Guide with their misleading directory services. There may be others that we are not aware of and are hence not named here. 

    These companies provide legitimate exhibition guides aimed at exhibitors across the globe offering online listing services. They use a form which resembles and organizer's free catalogue listing service, inviting exhibitors to complete the form for an entry in an on-line directory. Unsuspecting exhibitors who sign and return the form are then contracted into a three-year, non-retractable agreement, which could cost the exhibitor a significant amount of money, with very limited foreseeable benefits. The details are often available on the form itself, but are often too small and insignificant to be noticed. It is always wise to really the small print before signing a contract, and if the information is impossible to read then the contract should not be signed. These publications have no connection with SEMI or any of our events, and it is important that all companies are made aware of this. 

    Should you receive any communication from the Expo-Guide and Fairguide.com or related company, please IGNORE THEM COMPLETELY and DO NOT COMMUNICATE WITH THEM IN ANY WAY.

    For Technical Support with this webpage, please contact support.