Our prime products in SEMICON KOREA2019 are iPHEMOS-DD and Visible Nanolens.
iPHEMOS-DD enables your wafer, die or package sample to direct-dock by LSI tester and to run test programs at operation speed for dynamic fault localization. Visible Nanolens is a solid immersion lens for visual light source. Not only photo emission camera, thermal emission camera, OBIRCH and EOP/EOFM, but Visual Nanolens and visual light source are integrated on iPHEMOS-DD, which can cover whole range of fault localization. It can detect from resistive short by thermal camera to wave form delay of single transistor by using Visual EOP.