KOVIS is a manufacturing company of Handler & Metrology equipment which specializes both in wafer surface inspection and Micro Bump measurement/test by using high-performance metrology tool based on fully-automatic wafer handler robot technology.
KOVIS aims to fuse and simplify our products with creativity and innovation and dreams of sublimating the value of its products to the status of the arts.
World best technology of Metrology Automation by Contact/ Non-Contact
• EFEM/ Wafer sorter/ Wafer Handling Robot Systems
• Macro/ Micro Wafer Inspection System
• Reflectometer/ Spectrometer for Thin Film Measurement
• Stylus profiler, 3D Contact Profilometer
• Eddy current RS Measurement
• 3D Laser Confocal Optical Profiler
• Micro Bump Shear / Pull Tester
• Stereozoom microscopes & (IR) High power scopes