02-531-7800

E.D. Elettronica Dedicata s.r.l

  • Booth: D724


Semiconductors quality mantainance, Measured for success


 Press Releases

  • An electrical device is subjected to an electrical overstress event when a maximum limit for either the voltage across, the current through,
    or the power dissipated in the device is exceeded and causes immediate damage or malfunction, or latent damage resulting in an unpredictable reduction of its lifetime.
    “Overvoltage” events are considered as voltage transients above product’s maximum operating conditions as defined by the Product Specification,
    applied to power supplies and/or to I/O pins, having a duration ranging from 1 μsec up to some msec and occurring while the device is working in operative electrical conditions.


    FlexyEOS system verifies the intrinsic robustness of new products versus System Voltage Transient events, a subset of EOS family, with the aim to detect the failing threshold of the
    D.U.T. (catastrophic or parametric rejects) and map failure signatures on customer returns.
    In particular, the objectives are to:
    · Evaluate robustness of new IC vs “controlled” EOS events under operating conditions (HTOL dynamic mode) during new product qualification phase.
    · Reproduce EOS field failure on production devices improving Failure Analysis success rate and cycle time.
    · Broaden the existing knowledge on the effects of EOS events in order to improve the design of IC circuits and/or application boards and, thus, reduce ECC for EOS.

    This procedure is applicable to mixed signal and power products that manage inductive loads or to devices employed in applications that have a high disturbance conductive noise.
    In particular, an EOS characterization is recommended for products belonging to IRD Automotive.

    References:
    ISO 7637-2 : Road vehicles electrical disturbances from conduction and coupling.
    Part 2: Electrical transient conduction along supply lines only.

    ISO 7637-3 : Road vehicles electrical disturbances from conduction and coupling
    Part 3: Electrical transient transmission by capacitive and inductive coupling via lines other than supply lines.


 Products

  • FlexyTest
    Unique and innovative system to test and diagnose load board (Performance board) and identify any hardware problems without the use of automated test equipment (ATE)....

  • Verification and diagnosis of Loadboard: comes FlexyTest

    E.D. Elettronica Dedicata is proud to present FlexyTEST, a unique and innovative system to test and diagnose load board and identify any hardware problems without the use of automated test equipment (ATE).

    Borned from a specific need of semiconductors market, it is usable in every industry from military and space to industrial.

    FlexyTEST has many advantages, including a high level of customization, system modularity, quick configuration and a highly intuitive software control interface.

    What is FlexyTEST

    FlexyTEST system includes a set of functionalities allowing test program development, debug and test execution. The equipment is made of the main tester with housing system, application kits according to fixture types and DUTs, and of a software that we have entirely designed and developed.

    FlexyTEST main features:

    • Test recipe development and debug
    • Test recipe execution with full portability among different plants
    • Selftest and calibration
    • Real time monitoring
    • Connection and elements fail highlight
    • Load board tested at power on (ATE set-up)
    • Data logging and reporting
    • STDF and custom reports generation

    Why choose FlexyTEST

    FlexyTEST is the best solution for testing and diagnosing electronic boards and identifying any hardware problems without using the ATEs.

    Among the advantages of FlexyTEST:

    • Verify performance of load boards for different ATE models
    • Save time and money for failure troubleshooting
    • Improves the quality and reliability of the process during test
    • Load board validation in acceptance test
    • Preventive maintenance
    • Increase ROI on your ATEs
  • HV HT TDDB
    HV HT TDDB (High voltage , High Temperature, Time-Dependent Dielectric Breakdown) ...

  • Customized system able to characterize dielectric materials for R&D in semiconductor field.
    Thanks to the full parallelism, it's possible in short time do a statistic analysis of DUTs breakdown in critical conditions; up to 20Kvac and 150°C.
  • PED Board
    A dedicated board having the specific features that cover the requirements of the Power Electronics and Drives (PED). Designed for high end of motor driver, inverter, power conversion from few W or KW to MW....

  • PED

    A dedicated board having the specific features that cover the requirements of the Power Electronics and Drives (PED) applications. Accordingly, the PED-Board has been designed and realized to exploit the benefits of the NI SoM (formally sbRIO-9651) and LabVIEW graphical programming. PED-Board incorporates ADC, DAC, CAN-bus and many other functionalities that can cover the requirements of a typical PED project.

    Proposed PED-Board can be connected to almost every power converter thanks to the application specific Adapter Board. The Adapter Board is placed on top the PED-Board providing mainly the required connections to the outer world.

    PED-Board is the right companion for the so-called software-defined PED application
    One board, specific software…a world of possibilities

  • FlexyEOS
    Compact laboratory system for Electrical Over Stress robustness evaluation. Spike up to 90V on power supply and I/O pin of IC in dynamic conditions....

  • FlexyEOS is a compact system suitable for electrical over stress in semiconductor integrated circuits reliability test. The device under test works in operative condition with resistive‐inductive loads and stimulus as in final application, while the system monitors in real time the catastrophic failures. EOS spikes generation on main power supply and I/O pin over and under DUT nominal voltage.

    Electrical overview

    Electrical Over Stress on:

    • Main power supplies
    • I/O pins

    DUT in Dynamic Condition:

    •  Digital pattern generation
    • Analog waveform stimulations
    •  Real time power supply and signal monitoring
    •  Resistive‐inductive loads on board interface

    Spike settings:

    •  Positive or negative (not less than ground)
    •  Amplitude up to 60V
    •  Pulse width from 10μs to 500μs
    • Synchronous or asynchronous mode
    • Capacitive load up to 2200 μF

    Software Overview

    User friendly software interface developed in

    LabVIEW allow to define:

    • Stress configuration
    • Power supply settings
    • Digital pattern stimulation
    •  Analog waveform generation
    •  Signal monitor threshold
    •  Graph for realtime monitoring
    • HTML report generation.

BEWARE - Special Warning Notice about ExpoGuide and FAIRGuide

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These companies provide legitimate exhibition guides aimed at exhibitors across the globe offering online listing services. They use a form which resembles and organizer's free catalogue listing service, inviting exhibitors to complete the form for an entry in an on-line directory. Unsuspecting exhibitors who sign and return the form are then contracted into a three-year, non-retractable agreement, which could cost the exhibitor a significant amount of money, with very limited foreseeable benefits. The details are often available on the form itself, but are often too small and insignificant to be noticed. It is always wise to really the small print before signing a contract, and if the information is impossible to read then the contract should not be signed. These publications have no connection with SEMI or any of our events, and it is important that all companies are made aware of this. 

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