02-531-7800

EDAX

Suwon, Gyeonggi, 
Korea (South)
https://www.edax.com/
  • Booth: C128

EDAX is a leading provider of innovative materials characterization systems encompassing Energy Dispersive Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), Wavelength Dispersive Spectrometry (WDS), Micro X-ray Fluorescence (Micro-XRF), and X-ray Metrology.


 Products

  • Octane Elite EDS System
    The Octane Elite Silicon Drift Detector (SDD) Series take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window....

  • The design enhancements and analytical benefits of the Octane Elite Series advance SDD technology to the highest level of performance ever achieved in a commercially available EDS detector. They enable users to meet more of their materials characterization challenges with the best results.

    Low kV Performance

    The mechanical properties of Si3N4 allow the use of thinly fabricated windows, offering a great benefit in terms of sensitivity and optimal low voltage analysis.

    Optimized SDD Electronics

    • Fast pulse processing from mapping and quantification
    • Optimized data quality at all count rates
    • High resolution quantitative analysis at mapping speeds greater than 400,000 output cps

    Throughput

    EDAX EDS systems with advanced detection electronics offer the highest throughput count rates on the market for the best possible analysis and increased productivity.

    Reliability

    The material properties and durability of Si3N4 ensure the most robust and reliable detectors available for all EDS applications.

    Motorized Slid

    The motorized slide on the Octane Elite SDDs offers full control of the detector via the software and is optimal for analytical flexibility. It is idea for all Focused Ion Beam (FIB) system.

    EDS Analysis Software allows users to optimize their analysis time and get the best possible data from their sample

    • Smart Diagnostics and smart Acquisition facilitate optimized collection and analysis conditions
    • Smart Pulse Pile-Up Correction minimizes concerns typical of high count-rate collections and allows maximum use of SDD technology
  • Velocity EBSD Camera Series
    The Velocity™ EBSD Camera Series offers high-speed EBSD mapping with the best indexing performance on real-world materials....

  • The Velocity™ EBSD Camera Series offers high-speed EBSD mapping with the best indexing performance on real-world materials. Powered by a CMOS sensor, the Velocity combines fast acquisition with high sensitivity and low noise performance for optimal collection and data quality.

    Data collection rates up to 4,500 indexed points per second

    • EBSD maps can be collected in minutes for efficient SEM use, in-situ experiments, and 3D EBSD applications

    High-speed, low-noise CMOS sensor

    • Provides high sensitivity, low noise, and 120 x 120 pixel images for EBSD indexing at the highest speeds

    Orientation precision less than 0.1°

    • Clear characterization of deformed microstructures with standard indexing routines

    High indexing success rates

    • EDAX’s proven triplet indexing and patented Confidence Index provide unparalleled indexing performance on challenging real-world samples

    High-speed simultaneous EDS-EBSD collection

    • The Velocity EBSD Cameras have been optimized with compatible EDAX EDS detectors for efficient data collection at the highest speeds

  • Lambda WDS Analysis System
    The Lambda™ Wavelength Dispersive Spectrometry (WDS) Analysis System combines the EDAX WDS software with state-of-the-art spectrometers for improved accuracy and precision, guaranteeing the best results for your materials analysis....

  • The Lambda™ Wavelength Dispersive Spectrometry (WDS) Analysis System combines the EDAX WDS software with state-of-the-art spectrometers for improved accuracy and precision, guaranteeing the best results for your materials analysis.

    Scanning mode options include:

    • Automatic acquisition of one or many EDS elements
    • Ability to customize the scan range to your application using spectral Swipe Mode or manual input
    • User-selectable step size and speed
    • Peak and background modes for a selection of elements
    • Define elements through an intuitive periodic table interface
    • Software suggests diffractor, peak, and background positions

    Qualitative and Quantitative Analysis

    The EDAX WDS software with Smart Quant provides users with qualitative and quantitative measurements. Simultaneously collect and overlay EDS and WDS data for easy qualitative confirmation. The analyst can select a technique (EDS or WDS) for quantification of a desired element to improve precision and detection limits.

    Compact Design
    • Fits all SEM chambers with an available high-angle port
    • Installs on standard EDS port - No special chamber or port required
    Sensitivity
    • Combines X-ray optics and compact design to deliver superior count rates
    High Count Rates and Peak-to-Background Ratios
    • Rapid X-ray analysis at the best resolution available
    • Excellent resolution of the K lines of transition elements
    • Able to resolve most elemental overlaps
    Ease of Alignment
    • Automated routines improve operation, performance, and accuracy of data
    Seamless Integration with EDS and Easy-to-Use Software
    • Intuitive operation for EDS and WDS users
    • Improved X-ray microanalysis
    • Covers the entire periodic table
    Smart Focus

    The Smart Focus routine is a feature of the EDAX WDS software. The automated routine adjusts the sample height to focus the WDS signal and thereby enable the optimum performance of the spectrometer.

  • Orbis Micro-XRF Analyzers
    Now you can get advanced non-destructive elemental analysis with the flexibility to work across a wide range of sample types and shapes. There is minimal sample preparation. No coating is required....

  • Now you can get advanced non-destructive elemental analysis with the flexibility to work across a wide range of sample types and shapes. There is minimal sample preparation. No coating is required. Orbis Micro-XRF Analyzers incorporate fast, simultaneous multi-element X-ray detection with the sensitivity to analyze from parts-per-million to 100% concentrations. Users can conduct elemental analysis on small samples, such as particles, fragments, and inclusions, or automated multi-point and imaging analysis on larger samples, with all of the benefits and simplicity of an XRF analyzer.

    Innovative X-ray Optic/Video Geometry

    Orbis mounts its advanced X-ray optics and high-quality video camera perpendicular to the sample, making the instrument appropriate for a broader range of sample geometries. This innovative design provides true “what you see is what you analyze” capability. Obstruction of the X-ray beam, which leads to erroneous measurements, can easily be detected. If the camera has an obstructed view, then the X-ray beam is obstructed. Shadowing of the X-ray beam is eliminated when measuring samples with topography. In addition, qualitative analysis is more easily performed beyond the designed working distance range of the instrument.

    A Wider Range of Applications

    Orbis analyzers are ideal for a variety of applications including criminal forensics, industrial quality control, and non-destructive testing, plus materials, electronics, and geological sample analyses.

    EDAX Analyzer Models

    The Orbis Micro-EDXRF Analyzer is available in two standard models, Orbis MC Analyzer and Orbis PC Analyzer. EDAX offers a range of additional options for each model. These two models cover a wide range of applications where highly precise non-destructive elemental analysis is required. Orbis Vision Software is available on both models.

  • Clarity EBSD Analysis System
    Clarity™ ‒ The world’s first commercial direct detection system to produce high fidelity EBSD patterns. This revolutionary system eliminates detector noise and distortions, opening new doors to unparalleled EBSD pattern quality and sensitivity....

  • Clarity™ ‒ The world’s first commercial direct detection system to produce high fidelity EBSD patterns. This revolutionary system eliminates detector noise and distortions, opening new doors to unparalleled EBSD pattern quality and sensitivity.

    Clarity does not require a phosphor screen or light transfer system. The technology uses a CMOS detector coupled to a silicon sensor. The incident electrons generate several electron-hole pairs within the silicon upon impact and a bias voltage moves the charge toward the underlying CMOS detector, where it counts each event. This method is so sensitive that it can detect individual electrons.

    Beam Sensitive Materials Analysis
    • Delivers single-electron sensitivity with zero read noise.
    • Analyzes materials like perovskite solar cells that do not produce useable EBSD patterns under typical beam currents.
    • Eliminates the need for conductive coatings or low-vacuum SEM settings to assess non-conductive materials like ceramics that charge under typical beam currents.
    • At low beam currents, obtains high-quality EBSD patterns and maps for investigating the effects of grain boundaries, grain size, and crystal orientation.

    Traditional Materials
    • Uses high-dynamic-range imaging to ensure excellent EBSD pattern quality.
    • Enables the collection of extremely sharp EBSD patterns without using phosphor or optical lenses.

  • Quantitative Mapping of Lithium in the SEM
    Secondary electron image and elemental metal fraction maps (by wt. %) of the same region of the MgLiAl alloy; white pixels are regions excluded from the analysis due to the influence of topography (identified by arrows in the secondary electron image)....

  • Introduction

    Lithium (Li)-containing compounds and alloys are critical to many key technologies of the twenty-first century, from Li-ion batteries used to power mobile electronic devices and cars to lightweight structural alloys. Progress in these fields has been remarkable given the lack of a method to determine lithium content at the microscale. Commonly, Energy Dispersive Spectroscopy (EDS) in the Scanning Electron Microscope (SEM) is employed for microanalysis. However, this has not been possible for elements with atomic number (Z) <4 as the characteristic X-rays emitted (e.g., Li K at 55 eV) are easily attenuated by the sample or presence of an oxide layer or contamination and require the use of highly specialized detectors. Even so, a limit of detection of ~20 wt. % Li and the inability to perform quantitative measurements due to the dependence on the Li bonding state present significant issues [1]. However, quantification of Li in the SEM was demonstrated recently using a composition by difference method based on EDS and quantitative Backscattered Electron Imaging (qBEI) [2]. EDS analysis was used to quantify elements Z = 4 – 94, while qBEI was used to determine the mean atomic mass (the qBEI signal being a function of atomic number for Z = 1 – 94). The fraction of light elements (Z = 1 – 3) was calculated and, given the MgLi alloy analyzed, assumed to be Li. Using this method, detection of <5 wt. % Li was demonstrated with acceptable accuracy (~1 wt. %).

    Results and Discussion

    We extend the composition by difference method to generate quantitative, spatially resolved elemental maps of a MgAlLi alloy. The sample was cast with a nominal composition of Mg52.6Li18.3Al29.1 wt. %. The sample was prepared by broad beam argon milling using a Gatan Ilion® polisher. To minimize reaction with the atmosphere, the sample was transferred to the SEM immersed in isopropanol. A field emission SEM was used to collect EDS and qBEI maps at 3 and 5 kV, respectively, selected to reveal the sample microstructure while ensuring comparable sampling depths of the signals. EDS spectra were captured using an EDAX Octane Elite EDS System, and quantified elemental maps were calculated in the APEX software. qBEI was performed using a Gatan OnPoint™ backscattered electron detector and image analysis was performed using the DigitalMicrograph® software.

    In good agreement with thermodynamic simulations using Thermo-Calc software, secondary and backscattered electron images revealed a eutectic microstructure with 61:39 area % while EDS maps revealed a Mg-rich matrix and Al-rich MgAl secondary phase. Despite careful sample handling, high carbon and oxygen concentrations plus surface pitting in some regions provide evidence of reaction with the atmosphere. Sample topography is known to affect the backscattered electron yield and observed topographic features correlated with anomalous ‘dark’ features in the qBEI data (arrowed). To avoid incorrect data interpretation, these regions were excluded from the elemental maps that were calculated.

    Magnesium, aluminum, and, for the first time, lithium elemental maps were calculated using the composition by difference method [2] (Figure). The matrix was determined to be Mg90.6Li9.4 wt. % with little spatial variation; however, the second phase exhibited wide compositional variation from Mg26Li11Al63 to Mg10Li43Al47 (mean Li content of 35.5 wt. %). These results agree well with thermodynamic calculations predicting a Mg-rich matrix with BCC Li configuration and an FCC AlLi secondary intermetallic phase capable of accommodating broad ranges of Mg-content.

    Conclusion

    The results demonstrate that single-digit mass percentages of Li can be mapped quantitatively in the SEM using the composition by difference method. Limitations of the method are known to include surface topography, as well as the presence of unknown quantities of H or He (or voids). Nevertheless, the methodology offers distinct advantages compared to specialized “Li” EDS detectors.

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