When testing electrical performance to determine whether a semiconductor IC is good or bad, it connects an test equipment and a semiconductor device. As a consumable part, when developing a new device, companion development is essential, and it is characterizedby small quantity production of multiple types.
1. Memory Test Socket
-Provides optimized solution for all memory device/PKG and different test environments, from the smallest pitch ~ normal pitch (0.2P~1.0P).
2. Logic Test Socket
- Provides optimized solution for logic device/PKG test in accordance with the application, including long test time, short test time, high speed, large area, etc
3. RF Socket
- Provides RF test socket that responds to outstanding properties and high frequency by matching the impedance through unequaled technology and coaxial structure.