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Withtech is the very expert which you can rely on for Airborne Molecular Contamination Monitoring systems in Fab and Process Environments of Semiconductors and the FPD. Our goal is to continually help on your Process and Yield improvement through technology innovation as well as reliability of our products. Highly sensitive AMCs Monitoring systems (LOD0.1ppbv); HAM and NaVi series have been proven to be best and reliable in performance of AMCs detection in semiconductor and FPD industries. More than 10 years, systems have been operating for major semiconductor and FPD makers as standard systems. Our systems can be applied to monitoring of FAB environment, Photolithography, Reticle and Other Manufacturing Process in Semiconductors and FPD. Detectable Gases; NH3, HF, HCl, HNO2, HBr, HNO3, H2SO4, and CH3COOH, etc. SOLA system is also available for lowest metal contamination detection in cleaning process and purity of cleaning solution.