GATAN

Pleasanton,  CA 
United States
http://www.gatan.com
  • Booth: C636

OUR PURPOSE

There is always more to see. And when you’re working with electron microscopy, the closer you can get to your sample, the more of its secrets it will reveal.

That’s why at Gatan we have spent the last 50 years working with our customers to push the boundaries of what can be done with electron microscopy. Together, we have invented new approaches to problems that deliver fresh understanding.

With state of the art cameras, imaging energy filters, specimen preparation equipment and other EM products and solutions, we take the most powerful microscopy on earth and make it work even harder for you.

Gatan. Let’s get closer. 

 Products

  • GIF Continuum K3 System
    Electron counting for all your EELS, EFTEM, and energy-filtered 4D STEM applications....

    • ADVANTAGES 
     

    The GIF Continuum® K3® series employs the revolutionary K3 direct detection counting detector for the highest fidelity electron energy loss spectroscopy (EELS) and energy-filtered transmission electron microscopy (EFTEM) data possible. Powered by the DigitalMicrograph® and AutoFilter® platforms, the GIF Continuum K3 is simple to operate without sacrificing any of the power or flexibility needed for modern experiments. Pair the K3 with an optional scintillator detector or the Stela™ hybrid-pixel camera for the most versatile system available.

    Ideal for low-dose imaging applications and spectroscopy with CountedEELS modes

    • High sensitivity, large pixel count of the K3 detector is optimal for low-dose imaging and in-situ studies
    • Resolves atomic structures with high fidelity even at low intensities (80 – 300 kV)
    • Delivers the sharpest edges over the broadest energy range
    • DualEELS ensures you have both low- and core-loss that are key for modern EELS quantification

    Extend electron counting to low kV with Stela

    • Extends CountedEELS and EFTEM below 80 kV
    • Optimal for energy-filtered diffraction, micro-ED, and 4D STEM
    • Captures weak and intense reflections with the highest dynamic range

    Productivity that you expect with full DigitalMicrograph integration

    • One-button tuning and alignment on all detectors
    • Flexible yet straightforward STEM-EELS spectrum imaging with Live Mapping
    • One-stop analysis platform for all TEM/STEM applications reduces training time and cost
    • Powerful, multi-dimensional data analysis and visualization tools allow users to delve into and explore complex data sets effortlessly
    • Native support for DigitalMicrograph scripting and Python programming to customize your analysis
  • Metro In-Situ Counting Camera
    The cutting-edge counting camera for groundbreaking imaging, diffraction, and in-situ studies....

    • ADVANTAGES 
     

    Metro™ – The cutting-edge counting camera for groundbreaking imaging, diffraction, and in-situ studies. By enabling counting capabilities while operating your transmission electron microscope (TEM) at low accelerating voltages (60 – 200 kV), imaging your most sensitive samples and low-dose studies is now within reach. This not only enhances results but allows you to push the research boundaries for 2D materials, batteries, catalysts, nanotubes, polymers, and organic/biological materials.

    • Enables lower dose rates and detection of smaller signals at ≤200 kV on your existing TEM
    • Images the most beam-sensitive specimens
    • Captures fine details, even at the most extreme dose rates
    • Allows you to see higher-quality diffraction patterns with virtually no background
    • Stores in-situ, 2k video at ≤41 fps and 512 x 512 video at ≤492 fps
    • Acquires images with the simple but powerful DigitalMicrograph® interface that you are familiar with for the OneView® IS camera
    • With one click, corrects for drift with automatic sub-frame alignment
  • Monarc CL Detector
    Redefining what’s possible with SEM-based cathodoluminescence....

    • ADVANTAGES 
     
    Built upon a groundbreaking optical design, Monarc dramatically boosts sensitivity and spectral resolution, empowering the most complete cathodoluminescence (CL) analysis to date with unique wavelength- and angle-resolved capabilities. This true next generation CL detector now provides brand new insights in the most demanding applications in nanophotonics, optoelectronics, and geosciences.

    Fastest time to the best data

    • Acquire CL data with unmatched spatial (<10 nm), angular (1°), and wavelength (0.1 nm) resolutions
    • Simultaneously capture angle- and wavelength-resolved CL data
    • Collect hyperspectral data up to 30 times faster than other CL detectors
    Easy operation for all users
    • Guarantee optimal results with fully automated alignment and recipe-driven operation
    • Permanently aligned optics deliver reproducible results across the short- and long-term
    • Utilize the largest field of view to increase the data throughput and simplify user workflows

    Most accurate correlation with other signals

    • Detect multiple signals simultaneously for correlated imaging of physical properties and composition with CL data
    • No compromises – Make full use of the in-lens SEM detectors during CL measurements

    UNIQUE CAPABILITIES

    • Angle-resolved (ARCL): Understand how light and matter interact far below the optical diffraction limit – Provides a 400x larger field of view than other CL detectors with virtually no loss in resolution (patent pending)
    • Wavelength- and angle-resolved (WARCL): Visualize how light and matter interact across multiple viewing angles and wavelengths at full resolution – What was impossible or highly impractical, is now routine with Monarc’s unique optical design
    • Polarization filtering: Determine the emission polarization properties of deep sub-wavelength structures like optical nanoantenna, nano-cavities, and photonic crystals
  • Cipher System
    Cipher™ – The first and only system that quantitatively reveals the distribution of lithium in scanning electron microscopes...

    • ADVANTAGES 
     

    Cipher™ – The first and only system that quantitatively reveals the distribution of lithium in scanning electron microscopes and dual beam instruments. Using the groundbreaking lithium by composition by difference method (Li-CDM), Cipher determines the lithium content in metallic alloys, compounds, and complex metal oxides down to single-digit weight percentages accelerating the development of renewable energy materials and aerospace alloys.

    • Reveals the previously unobservable distribution of lithium at the microscale in a wide variety of materials
    • Determines the charge state of oxide particles used as cathodes in lithium-ion batteries, such as lithium nickel manganese cobalt oxide (NMC) and lithium iron phosphate (LFP)
    • Delivers quantitative analysis of lithium with a greater than tenfold improvement in the minimum detection limit
  • PECS II System
    Broad argon ion beam system designed to polish and coat samples for SEM imaging and analytical techniques....

    • ADVANTAGES 
     

    Fully automated argon ion polishing system suitable for preparation of SEM samples to prepare damage free surfaces, cross sections and deposit coatings to protect or eliminate charging.

    • Polish, etch or coat samples with a single pump down
    • Etch at voltages as low as 100 V for rapid and damage free preparation of sample surfaces 
    • Permit samples as large as 32 mm in diameter
    • Transfer samples from the PECS™ II instrument to a SEM/FIB or glovebox without exposure to air (optional)
    • Store and analyze image in DigitalMicrograph® software from Gatan for digital optical imaging
    • Display and control all PECS II parameters using integrated 10-inch color touch screen
  • Solarus II Plasma Cleaner
    The next-generation plasma tool to remove hydrocarbon contamination from TEM and SEM samples and holders....

    • ADVANTAGES 
     

    This system is ideal for researchers who want to reproducibly remove organic surface contaminants in a safe, efficient manner.

    • Integrated holder bakeout and storage: Reduces tool footprint and cost of ownership
    • Enhanced user interface: Use preoptimized recipes for consistent results; as well as guided workflows to ensure proper operation when venting and evacuating the chamber
    • Low-power operation (2 W): Gently clean delicate samples (e.g., holey carbon grids); as well as prepare hydrophilic surfaces on carbon grids for cryo-electron microscopy
    • New system, same great performance: Remove hydrocarbons on TEM and SEM samples that may impact analysis

Categories

203 Equipment, Inspection & Measurement
  • Microscopes: Scanning Electron Microscope (SEM); Focused Ion Beam (FIB), Transmission Electron Micr
    • 207 Equipment, Process
  • Ion; E-Beam Milling Etching Equipment
    • 401 Sub-systems
  • Cameras - Still; CCD; Video & Monitors
  • Computer ; Control ; Communication ; Data Acquisition Systems
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