AhTECH LTS Co., Ltd.

Anyang-si, Gyeonggi-do, 
Korea (South)
http://www.ahtech.co.kr
  • Booth: B435


Welcome! Thank you for your interest in Ahtech LTS.

Since 1994, we have traded and exported materials and equipments related to electronics, semiconductors, displays, and battery. Not only we have sourced numerous materials, we’ve also manufactured equipments, and provided technical supports. Up to now, we’ve provided state-of-the-art technology, and pursued best quality products for our customers. We will always strive to find the optimal solution, and satisfy our customer’s needs.


 Products

  • UV Ozone Cleaner
    UV Ozone Cleaner is used for surface cleaning and surface modification of substrates and samples using ultraviolet lamps....

  • Our UV Ozone Cleaner cleans the substrate surface in a short time using a high-power UV Grid Lamp.

    With high power and excellent Uniformity, Grid Type Lamp can generate ozone, decompose organic surface contaminants, and evaporate quickly into volatile compounds to create a clean surface without damaging the sample.

    We handle a wide range of materials for a wide range of applications and have products of various sizes. Per each machine’s spec, it can be tested with no limitation.

  • Non-Contact Resistance Measurement System
    Equipment for measuring surface resistance and thin film thickness using Eddy Current...

  • * Our non-contact surface resistance measuring equipment uses Eddy Current's principle to measure surface resistance and thin film thickness without damage.

    - Various types of equipment such as Manual Type, Semi Auto, Inline type, Full Auto, etc.

    - It is possible to measure samples in various fields such as film, wafer, glass, foil, etc.

    - Simultaneous measurement of surface resistance and thin film thickness

    - Unlike the 4-point probe, the surface is not damaged by non-contact measurements

    - Quick measurement is available

    - Measurement of conductive material enclosed by insulation

    - Even soft-surface samples can be measured

    - Measurement of conductive thin film thickness available

  • Test Wafers (AMAG7)
    Wafer samples for diagnostic and equipment development, evaluation, monitoring and calibration of semiconductor equipment...

  • Challenging and/or diagnostic samples, representing leading edge of key semiconductor technologies, are crucial for application development, for developing, evaluating, monitoring & calibrating equipment, and for collaborating with other entities. Access to such samples also determines which experiments are possible and what can be published externally versus internally, and can limit advertising options. 

    The AMAG7 reticle is a comprehensive new advanced metrology patterning reticle and test pattern collection, derived from SEMATECH AMAG’s AMAG4/5/6 and modernized to today’s metrology and processing community’s needs. 

  • Test Handler
    Our product includes turret-based and linear pick-and-place handlers as well as customized solutions that incorporate the advantages of both designs....

  • Our product includes turret-based and linear pick-and-place handlers, as well as customized solutions that incorporate the advantages of both designs.

    Small size package inspection, functional test and pick & place (Tape & Reel)

    - Processes: Orientation, Flip, Test, Vision Inspection, Laser Marking, Repark, Retest, Reject, and sort.

    Core Technology & Products

    - Specialized for small size product handling with high input/ output loading flexibility

    - Turret Systems (Advanced turret system)

      * Input: Bowl/ Tube/ Tray/ Reel

      * Output: Tape & Reel + Others (Tube/ Bulk/ Tray/ Dual Type)

      * Major functions: Visual & laser mark inspection, Functional test 

    - Pick and Place

  • Microscope
    A microscope that allows easy and clear image viewing by connecting to a large monitor, PC, etc....

  • There are various models of microscopes and accessories that allow you to view high-quality images by connecting to Pc and monitors.