NEOSEM Inc.

- To support customers to have the capability to deliver automotive LED products to the market with high reliability, Neosem develop and released LX500-LED accelerated aging tester.

- By adopting NEOSEM patented temperature control algorithm, the customer can execute LED device aging     test at very stable temperature.

- Target : LED for automotive application.

- Temperature Range : 85 ~ 110℃

- Supports Automation system for all type of Neosem tester.

- Capabilities and Offerings range from simple robotic applications through full factory  solutions. 

- Provides both Automated total test solutions, as well as Automation solutions that can integrate existing customer test equipment an factory material handling infrastructure.

- DRAM, NAND Flash, PRAM Support

- 200HMz, 100MHz, 20MHz

- Full Functionality Test or BIST

- -60℃ ~ +150℃

- Flexible per Site BI Testing

- Automation Ready

- Ambient

- -10℃ ~ +65℃

- DUT Module or Test Board Configurations

- Batch and Asynchronous Testing

- Hybrid FT and BIST Configurations

- Automation Ready

- -40℃ ~ +125℃

- DUT Module or Test Board Configurations

- Batch & Asynchronous Testing

- Hybrid FT and BIST Configurations

- Automation Ready