0.5 Micron with Unlimited Sample Size:
Image with 0.5 micron spatial resolution anywhere on samples up to 300 mm in diameter. With Apex XCT, you can streamline your FA workflows by imaging whole intact packages, wafers, and PCBs, mitigating time-consuming and destructive sample preparation protocols.
Isochronous Data Acquisition:
Data acquisition time is independent of sample size when using Apex XCT. Unlike legacy CT systems where bigger samples equate to longer measurement times, the unique geometry of Apex XCT preserves high throughput operation even as sample sizes grow very large, such as printed circuit boards, motherboards, and wafers.
Unbiased Contrast:
Apex XCT eliminates many of the imaging artifacts that affect operation of conventional 3D X-ray systems, such as beam hardening, streaking/curtaining, photon starvation, and metal artifacts. In comparison with a leading Conventional XRM/microCT, the Apex XCT result demonstrates a dramatic increase in image quality while also offering a significantly reduced scan time.
APEX XRM ADVANTAGES WITH TECHNICAL INNOVATIONS:
- High throughput (>10X) for advanced packages, pcbs and wafers. Can acquire high quality tomographies within 15 minutes.
- Patent-pending geometry preserves high throughput for large specimens
- Rapid True 3D volumetric imaging at 0.5 µm resolution