Characteristics
1.Responds to high-cost performance and the manufacturing of multi-product memories
(1)For every test head, 3,072 memory devices can be simultaneously measured,
and the test head can independently start the test, so the test of the memory product can be optimized
(2)For every test head, the test of different products is possible and thus optimized for multi-type production
2.Supports the wafer test processes of all memory devices
(1)In response to all memory products including DRAM, NAND Flash, NOR Flash, SRAM, MCP, etc.
(2)With wafer test, responds to Known Good Die (KGD)
3.In response to low power
With the use of the latest device and the effect use of electric power, 30% of electricity use can be reduced
4.Brings convenience of the user
With the user interface (AViPS) in case of GUI, the development and analysis times of the test Program can be reduced