02-531-7800

YC

Seongnam-si, Gyeonggi-do, 
Korea (South)
http://yikcorp.com
  • Booth: A152


Welcome to YIK Corporation

YIK Corporation, which is to develop and manufacture the memory test system, is recognized as the world-wide technological leading company in the semiconductor wafer test business.

To satisfy the needs of customers in the rapidly changing semiconductor industry, YIKC provides high-performance and cost-effective semiconductor testers that are designed to lower the cost of testing various types of memory device such as DRAM and FLASH.

Also, YIKC has maintained high market share rate in the semiconductor tester business.
In terms of customer satisfaction, YIKC will continue its effort to product quality, and we ask for the continued support and encouragement of our customers.


 Products

  • MT6122 Memory Test System
    MT6122 Memory Test System, which shares the platform with MT6133 Memory Test System, is a high performance evaluation, and reading mass produced memory test system with the purpose of carrying out flash memory wafer tests....

  • Characteristics
    1.Chooses a platform that enables flexible selection of operating frequency, degree of precision of DC, and the throughput
    (1)Expands operating frequency to enable the testing of maximum 1,536 memory devices per test head (I/O Shared) and allows for the extension of the pin numbers

    (2)With unit expansion, its capacity can be upgraded to the level of MT6133

    2.Supports processes for major memory device wafer test
    In response to NAND Flash, DRAM, NOR Flash, etc.

    3.In response to low cost/low power
    Reduced price and power use through the optimal unit composition

  • MT6133 Memory Test System
    MT6133 Memory Test System can test a 300 mm wafer with 1 shot to become a next-generation, high-precision memory tester for evaluation, reading and mass production with high-capacity defect analysis and repair functions....

  • Characteristics
    1.Responds to high-cost performance and the manufacturing of multi-product memories
    (1)For every test head, 3,072 memory devices can be simultaneously measured,
    and the test head can independently start the test, so the test of the memory product can be optimized

    (2)For every test head, the test of different products is possible and thus optimized for multi-type production

    2.Supports the wafer test processes of all memory devices
    (1)In response to all memory products including DRAM, NAND Flash, NOR Flash, SRAM, MCP, etc.

    (2)With wafer test, responds to Known Good Die (KGD)

    3.In response to low power
    With the use of the latest device and the effect use of electric power, 30% of electricity use can be reduced

    4.Brings convenience of the user
    With the user interface (AViPS) in case of GUI, the development and analysis times of the test Program can be reduced