AVACO

Daegu,  Korea (South)
http://www.avaco.com
  • Booth: C804

AVACO provides total solutions for high-tech industry.

Overview

AVACO provides total solutions for high-tech industry.

AVACO is a comprehensive equipment company that manufactures core equipment for the display, semiconductor, secondary battery, and microelectronic industries. AVACO is developing technology with global research institutes to secure next-generation semiconductor technology. AVACO manufactures measurement and inspection systems and process equipment.


  Products

  • Metal Sputtering System (AVALAN)
    Ultra-purity metal films manufacturing system by strictly controlling the film properties for semiconductors....

  • - High quality PVD and etch process on substrate size from 200mm to 300mm

    - Ultra-pure metal film manufacturing system that strictly controls semiconductor film properties

    - Flexible system that combines various process chambers to enable multi-step processes for specific applications

    - Available up to nine process chambers including optional multi-degas and precleaning

    - Demonstrates high reliability and provides more CoO benefits

  • Macro Inspection System (Ostri-M)
    Macro inspection system is high-performance optical system that detects, identifies, and classifies foreign materials and pattern defects on the surface and edge of the wafer through the wafer inspection and review system....

  • - Measure and analyze the defect image by receiving location coordinates of defects from the macro inspection system

    - Measure the defect image using a high magnification lens

    - Detect defects to the um level by applying the inspection function

    - Bright field and dark field review available

  • 3D Inspection System (Ostri-W)
    3D inspection system is a high-performance optical system for measuring the height and obtaining topological information of the wafer non-contact methods through the wafer inspection and review system....

  • - Measure and analyze the defect image by receiving location coordinates of defects from the 3D inspection system

    - Measure the defect image using a high magnification lens

    - nm level shapes can be detected by applying the 3D inspection function

    - 3D mapping and review available