Bruker’s large-sample Dimension IconIR™ system combines nanoscale infrared (IR) spectroscopy and scanning probe microscopy (SPM) on one platform to deliver the most advanced spectroscopy, imaging, and property mapping capabilities available for academic researchers and industrial users. Incorporating decades of research and technological innovation, IconIR provides unrivaled performance based on and building off the industry-best AFM measurement capabilities of the Dimension Icon®. The system enables correlative microscopy and chemical imaging with enhanced resolution and monolayer sensitivity, while its unique large-sample architecture provides ultimate sample flexibility for the broadest range of applications. For example, the new IconIR polymer solution is an all-in-one package designed to include everything one would need to address key polymer research needs. The Dimension IconIR platform has the highest performance in the world for AFM-IR measurements, leveraging advancements in IR laser sources, system designs, and operating modes.