MT8311 is the Next-Generation Wafer Tester for DRAM and Flash Memories based on YC's latest technology.
Equipped with 13k DPS and Signal, latest Memory Products can be tested with One Touch Down.
In addition, you can accumulate fail data in real-time in a large amount of Fail Memory and maximize Wafer yield through High-Speed Repair Analysis and Operations.
Based on these features, we provide high productivity and efficiency to our customers.