Nidec-Read Corporation

  • Booth: 202

NIDEC-READ Corporation. 

1.MEMS Spring Probe

The Nidec-Read original developed MEMS Spring Probe is advanced and innovative test solutions at PCB & semiconductor testing market.

2. Bump Inspection Tool

The simultaneous 3D/2D optical inspection system Rwi series machine is one of the best solution for the wafer Bumping process full auto AOI inspection.

 

SV Probe pte.

The brand new Nidec-Read Corporation family, SV probe is an innovative, solutions-driven designer, manufactures high performance probe cards for the semiconductor industry.


 Additional Info

New Exhibitor:
No
New Products:
Yes
Displaying Equipment:
No
Product Demonstrations:
Yes
Please indicate which industries/technologies your company serves
LED/solid state lighting, MEMS, Other, Photovoltaic, Plastic/organic/flexible electronics, Power Semiconductors, Semiconductor