1.MEMS Spring Probe
The Nidec-Read original developed MEMS Spring Probe is advanced and innovative test solutions at PCB & semiconductor testing market.
2. Bump Inspection Tool
The simultaneous 3D/2D optical inspection system Rwi series machine is one of the best solution for the wafer Bumping process full auto AOI inspection.
SV Probe pte.
The brand new Nidec-Read Corporation family, SV probe is an innovative, solutions-driven designer, manufactures high performance probe cards for the semiconductor industry.
New Exhibitor: No
New Products: Yes
Displaying Equipment: No
Product Demonstrations: Yes
Please indicate which industries/technologies your company serves LED/solid state lighting, MEMS, Other, Photovoltaic, Plastic/organic/flexible electronics, Power Semiconductors, Semiconductor