The operability so well received in earlier models has been further improved, resulting in much simpler and easier-to-see windows.
The enlarged fluoroscopic exterior image view provides a new level of visibility.
The measurement functions are so much easier to use that results can now be obtained with just a click, and require no complicated parameter settings.
New functions such as enhanced region-of-interest display have been incorporated, complementing a wealth of conventional functions including navigation via exterior images, step feed, teaching, and image browsing.
Both the SMX-1000 Plus and SMX-1000L Plus provide high-magnification nondestructive fluoroscopic examinations of junction conditions (disconnect, contact) of ultra-micro parts on high-density PCBs, BGAs, CSPs, or system LSIs.