• Booth: 535

Insight k.k. was founded in 1989 in Tokyo, Japan. Insight offers systems, services and training in the field of  non-destructive evaluation technology (NDE). In particular, Insight specialized on non-destructive evaluation by using Ultrasound technology. Driven by a group of experienced engineers, working in the field of Non-Destructive Ultrasound Evaluation since more than 35 years, Insight successfully introduced our own line of Ultrasonic C-SCAN analysis systems to the Japanese market in 2006. Today, Insight instruments are installed worldwide, in all major markets (Electronics, Automotive, Aerospace, Defense). 

The Insight-Scan (IS) series of Scanning Acoustic Microscopy (SAM) instruments integrates the finest state-of-the-art technology for high resolution, high speed, fully digital non-destructive sample analysis. Two different standard instruments are available: the high-resolution compact IS-220 instrument and the larger IS-350 system. If none of them fits your specific needs, the FlexScan instrument can be fully customized in scan size, scanner drive technology, and resolution.

Insight k.k. offers whole system of Scanning Acoustic Microscopy (SAM) and also related peripherals such as Transducers, Pulsar Receiver and so on. In the meanwhile, Insight k.k. offers a customer’s sample test as follows;

  • CSP and Flip Chip underfill void evaluation and delamination analysis
  • Power semiconductor integrity evaluation
  • Internal defect inspection: Inclusions, Cracks, die tilt in metals, plastic, resin, bonded wafer and so on
  • Void evaluation in welds and brazed interfaces
  • Delamination of composite materials

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MEMS, Other, Power Semiconductors, Semiconductor