BRUKER SURFACE MEASUREMENT SOLUTIONS - For SEMICON
Manufacturers today require extremely accurate, repeatable and flexible metrology to ensure competitiveness.
Bruker offers a wide range of 3D Optical Solutions featuring rapid, non-destructive and automated performance for 3D critical dimension (CD) metrology for Semiconductor/MEMS manufacturing and IC packaging.
Visit us at Booth 619 to learn more about Bruker’s 3D Optical Solutions. or visit www.Bruker.com/Nano