Cohu Malaysia Sdn. Bhd.

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cCompact Contactor
Ideal for Multisite Testing of Analog and Smart Power Device Requiring Kelvin Test. Innovative High Density Socket Architecture for High Parallelism Applications.... More Info Less Info



High Productivity:
• Extremely long cleaning interval
• Easy single pin replacement
• Very long pin life due to use the Denmark Alloy
Key Features:
• Reduced site to site pitch concept enables high parallel test for power applications on Strip test and Pick&Place handler platforms
• Outstanding CRES stability
• Smallest pitch: 0.40 mm
• Static connection to load board
• Current carrying capability 2.5 A

cDragon Contactor
For Mixed Signal, Precision Analog and RF Applications. Excellent RF Performance with Low Cost of Ownership.... More Info Less Info



High Productivity:
• Elastomer-free design for long life
• Very easy to maintain
• Pin replacement in <5 minutes
• No loadboard wear & tear
• Industry leading long lifetime
• Extremelty long cleaning intervals
Key Features:
• Revolutionary single spring & small from factor design
• Very low loop inductance & high bandwidth
• Outstanding CRES stability
• Insertion loss 22 GHz @ -1 dB
• Inductance 0.43 nH
• Smallest pitch available 0.30 mm
• Wide package range SO, DFN, QFN, QFP
• Temperature range -55 °C to +155 °C
• Constant contact force at each temperature setpoint
• Best temperature accuracy by multi-beam contact spring architecture

cHybrid Turret Contactor
For Leaded and Leadless Devices Down to 0.3 mm x 0.6 mm. ... More Info Less Info



High Productivity:
• New Denmark pin material
  - Prevents solder migration
  - Long cleaning intervals - 50,000 cycles
  - For pure pin
  - Lifetime more than 1 million cycles
• No load board wear
• Fast application board exchange without socket adjustment
• Singe pin replacement drives cost of test significantly down
• Short index time due to innovative socket & system integration
Key Features:
• Kelvin / none Kelvin configuration available
• Side-by-side for very small pad sizes
• Smallest device size 0.3 mm x 0.6 mm
• Insertion loss 5 GHz @ -1 dB (S21)
• For QFN, DFN, SO, SOT devices
• Compact multi-beam pin structure for high density system integration

cViper ProbeHead Contactor
High Performance ProbeHead for High Volume Production Test.... More Info Less Info



Benefits:
• Lab and volume production test
• Singulated devices or wafer-level test
• Low and stable contact resistance
• Bandwidth up to 27 GHz
Key Features:
• Low loop inductance and high bandwidth
• Device pitch down to 100 µm
• Variety of contact materials to optimize performance
• Manual actuation of singulated devices

xWave Contactor and ProbeHead
Broadband Production Solution for cmWave and mmWave up to 100 GHz. ... More Info Less Info



Benefits:
• Lab and volume production test
• Backhaul cellular netowrk applications
• WiGig and WirelessHD applications
• Automotive radar applications
• BGA, fBGA, LGA, QFN, WLCSP
• Pitches down to 0.3 mm (handler), 0.15 mm (prober)
Key Features:
• Shortest impedance-matched RF path
• Minimized number of signal transitions
• Solder-down performance
• Proven in production > 1.5 M cycles on handler
• Integrated assembly available


Infra-Red Module

Module for enhanced micro-crack and sub-surface defect detection on wafer-level chipscal packages (WLCSPs).... More Info Less Info





Infra-Red imaging has the ability to see through silicon, inspecting the structure underneath the surface that is not otherwise observable with traditional vision inspection systems. Cohu's vision module offers a breakthrough by integrating infra-red imaging onto a high-speed automation platform that delivers an economical solution for high quality inspection. This module, in combination with previously announced Aquilae inspection and 3D Flex metrology, further strengthens Cohu's differentiation in the growing semiconductor inspection market.

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