CXsemi Company Limited

Hsinchu County, Zhubei City,, 
  • Booth: 625

We provide the best solution for your measurement system.

We provide a new system to measure the material film thickness of wafer surface. Including PR, oxide film, and/or nitride film.  Besides a new metrology, we also promote a machine vision system with AI solutions to help the customers improving the quality control of production. 

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