NI Southeast Asia Sdn Bhd

  • Booth: 401

The IoT is driving increased product integration from the IC to the end device. To overcome the shortfalls of traditional automated test equipment, semiconductor orgs. need smarter test systems able to simplify data correlation from production to characterization to lower system costs and decrease time to market. With NI’s smarter platform approach, built on modular PXI hardware, open LabVIEW system design software and TestStand test management and data analysis software, semiconductor manufacturers are increasing test coverage and improving throughput while reducing cost for RF and mixed-signal test. 

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