The chromatic confocal line sensor CHRocodile CLS 2.0 is the ideal tool for precise 3D inline quality control in harsh industrial environments. It is highly suitable for applications in semiconductor industries and consumer electronics, such as inspecting the topography of smartphone housings or semiconductor chips, as well as measuring and inspecting solder bumps or detecting die cracks.
The 3D structure of your sample is determined in a very short time through fast line scanning at up to 18300 lines per second – ideal for inline applications where cycle time is critical. The chromatic confocal measurement technology provides data with an extremely high lateral and axial resolution, enables measurement of any kind of material, and functions without shadowing effects – even for complex geometries.
Furthermore, the easily exchangeable optical probes offer a high degree of flexibility in adapting the sensor’s specifications to your requirements. You can select a long line of up to 12 mm for fast inspection of large parts or a shorter line with an outstanding numerical aperture for measuring highly angled surfaces, e.g. the chamfer of smartphone or watch display glasses.