The FTI 1000 power discrete tester utilizes a ‘Tester-per-Channel Board’ design based on the USB bus that allows easy system scalability for multisite applications. The tester consists of independent DC and AC test channels that allow all test parameters to be tested either separately, or in one handler insertion. The AC parameters tested by the FTI 1000 include Inductive Load (UIL/UIS), Gate Charge (Qg, Qgs, Qgd), Gate Resistance and Capacitance (Rg, Cg, Coss, Ciss), and Resistive and Inductive Switching Tests. FTI 1000 also offers VI test resources to enable Gate Driver and other power IC’s to be tested.
FTI 1000 can be easily configured to perform parallel tests with many different types of multisite handlers, including gravity, turret, strip and wafer ring handlers. FTI 1000 can also be configured for wafer prober/CP parallel test to x16 die, DC and UIS tests. FTI’s highly flexible ‘FTI Studio’ software is Dot Net based and has a multi-threaded architecture which allows our testers to easily perform parallel tests in many different multisite test modes including Index Parallel, with no test-time penalty.
In addition to best-in-class production test performance, the FTI 1000 also offers a feature-rich range of software engineering tools. These include Scope Tool, Data Sheet Tool, TDDB and a Parts Average Test (PAT) Tool.