Focused Test, Inc.

Boulder,  CO 
United States
http://www.focusedtest.com

• Booth: 413

Please drop by our booth to see a demo of SiC MOSFET tests

Overview

Focused Test designs, manufactures and supports a family of power discrete, power module and power IC test systems for engineering and production test applications. Our company headquarters are located in Boulder, Colorado, USA and we maintain applications engineering centers in San Jose CA and Dallas TX in the USA and in Focused Test Philippines Inc., Metro Manila.

Focused Test, Inc. (FTI) testers have a ‘Tester-per-Channel Board’ design which uses the USB bus to allow easy system scalability for single and multisite applications. FTI testers can be easily configured to perform parallel tests with many different types of multisite handlers, including gravity, turret and strip handlers. FTI’s highly flexible ‘FTI Studio’ software has a multi-threaded architecture which allows our testers to easily perform parallel tests in many different multisite test modes including Index Parallel, True Parallel and Ping Pong with minimum test-time penalty.  Our C code compiler allows the user to edit existing test functions in the extensive test function library or to develop new tests. 

In addition to best-in-class production test performance, FTI also offers a feature-rich range of software engineering tools. These include Scope Tool, Data/Curve Tracer Sheet Tool, TDDB and a Parts Average Test (PAT) Tool that implements the AEC Q001 Rev C standard.

FTI 1000 Power Discrete Test System                

FTI 1000 consists of independent test channels that allow all DC and AC power discrete parameters to be tested either separately, or in one handler insertion or prober touch-down.  DC test ranges to 200A and 5kV, AC tests include Single and Double Pulse Inductive Switching  (UIS, Eon/Eoff), Timing (ton/toff)  Gate Charge (Qg, Qgs, Qgd), Gate Resistance (Rg), Ciss/Coss/Crss, Delta Vsd and Short Circuit SOA.  FTI 1000 also targets Wide Band Gap applications such as Dynamic Rdson test for GaN HEMT, SiC UIS test to 4kV, including Diode Mode UIS and Half Bridge modules.  

FTI 2000 Power Management IC Test System

FTI 2000 uses a ‘Tester per Channel Board’ design to test a wide range of Power IC’s with very low cost of test and high test floor scalability for multisite and multidie applications. FTI 2000 provides an innovative handler interface and docking solution for high test floor reliability with low cost of ownership.

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