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Hi-Tech Instruments Sdn Bhd

Puchong,  Selangor 
Malaysia
https://www.htiweb.com
  • Booth: 3326

~ Visit us @3326 to have a LIVE DEMO on VP-SEM and TT-SEM! ~

Overview

YOUR DEPENDABLE PARTNER IN SOLUTION-SPECIFIC INSTRUMENTATION

That’s us, Hi-Tech Instruments (HTI).

As a team that has garnered an enviable reputation as ‘the local partner in Hi-Tech Instruments’, HTI is positioned to deploy the vast expertise and specialised knowledge to serve ASEAN and global markets beyond the region.

Our partnerships with the world’s leading manufacturers have enabled us to reach the highest level   of   sophistication in imaging and characterizing both micro- and nano-worlds. HTI takes pride in providing true customer specific solutions based on light, laser, x-ray, ion and electron excitation of materials.

Every unique success story is made possible through our unrivalled solution-specific approach. We have assisted customers in the fields of semiconductor, material science, green technology, nanotechnology, life and medical sciences, data storage technology, precision machining, environmental, earth and planetary sciences.

Our broad instrumentation range, in-house laboratory coupled with our expertise and experience cuts turnaround time to a minimum, thus enabling all of our new   or existing customers to expeditiously implement our solutions into their laboratories or facilities.

HTI has continuously achieved high level of customer satisfaction through our proven and documented track record of outstanding tool uptime and exceptional service records. Professional support, consultation, comprehensive in-house training courses as well as our ability to anticipate our client’s needs are attributes that engraved in HTI’s reputation.

Solution suites suitable for logic, memory, advanced power, display, data storage, analog and MEMS device analysis.

  • E-beam nano-probing localization of transistor & metallization faults
  • Uniform wide area x-sectioning of sub 7nm node devices
  • Ga-free ultrathin TEM lamella preparation enables atomic-scale characterization 
  • Automated Cut-and-See & reconstruction at nm step precision of advanced 3D devices
  • Atomic scale Surface-Bulk analysis of the widest range of materials
  • Sub-nm resolution observation and analysis (EDS/EELS) of topmost surface contamination, voltage contrast, etc
  • Elemental & organic depth profiling of surface and its interfaces

Hi-Tech Instruments ............ you might say that we are “instruments” to the solution


  Products

  • Hitachi aberration-corrected TEM/STEM/SEM HF5000
    The Perfect Harmony of Imaging, Resolution & Analytical Performance...

    • Hitachi fully automated probe-forming spherical aberration corrector
    • High-brightness and high-stability cold FE electron gun (Cold FEG)
    • Ultra-stable column and power supplies for enhanced instrument performance
    • Simultaneous Cs-corrected SEM & STEM imaging capability with atomic resolution
    • New high-stability side-entry specimen stage and specimen holders
    • Symmetrically opposed dual 100 mm2 EDX* detectors : "Symmetrical Dual SDD*"
    • Newly designed enclosure for optimum performance in real laboratory environments
    • A wide range of Hitachi advanced specimen holders*
  • Hitachi FIB-SEM-Ar Ethos NX5000
    3D structural analysis at nanometer scale...

    • High-Performance FE-SEM Column with Dual Lens Mode

      • Ultra-high-resolution observation (HR mode: semi-in-lens)

      • High-accuracy end-point detection in real time (FF mode: time sharing mode)

    • High-Throughput Material Processing

      • Ultra-fast processing with high ion-current density

      • User programmable script for auto processing and observation

    • Microsampling System

      • Fully integrated sample-orinetation control for Anti-Curtaining Effect (ACE technology)

      • TEM sample preparation for uniform lamella at any orientation

    • Triple-Beam Capable, Delivering Advanced Quality Results

      • Low-acceleration noble-gas ion-beam material processing

      • Innovative functions reduce Ga ion related and other milling artifacts

    • Large Multi-Port Chamber and Stage for Various Applications

      • Large sample size capable system with exceptional stage stability

      • Full range enhanced long-distance tracking 

  • Hitachi CFE-SEM SU8600
    Exclusive Cold FE-SEM Dominance Unleased...

    • Exclusive Cold Field Emission Soure merits
    • Exclusive ExB energy filtering
    • Exclusive Super ExB signal mixing
    • Exclusive Semi-in-lens Objective Optics
    • Beam Deceleration Technology
    • Pure signal detections for absolute surface information 
    • Single molecular layer sensitivity 
    • Sub-10nm EDS mapping with Windowless SDD
    • Surface (SEM) to Bulk (STEM) correlative microscopy
  • Hitachi SFE-SEM SU8700
    Redefining sub-nm Schottky FE-SEM Pinnacle...

    • Schottky Field Emission Source
    • Integrated beam booster solumn
    • Compound objective lens flexibilities
    • Symmetrical in-column signal ddetections for all modes
    • Class-leading analytical geometry
    • Ultralow voltage Beam Deceleration (+/-) Technology
    • Low voltage BSE imaging for array tomography & HD capturing
    • Ultra vataible pressure Detector (UVD) for Topo, CL & STEM
    • Photodiode Backscattered Electron Detector (PD-BSD)
  • PSC O-PTIR mIRage
    Optical Photothermal Infrared Spectroscopy (O-PTIR) - beyond the limits of traditional IR microscopy...

    • Sub-micron spatial resolution
    • Non-Contact measurement (far-field)
    • Transmission FTIR quality spectral quality in reflection
    • Little to no sample preparation
    • Simultaneous IR + Raman
    • Co-located IR + Raman + Fluorescence
  • IONTOF TOF-SIMS M6
    SIMS Technology - always one step ahead...

    • Surface imaging: High lateral resolution (<50 nm) 
    • Surface spectroscopy: new level of mass resolution (>30,000) and sensitivity
    • Unique delayed extraction mode for high transmission with high lateral and high mass resolution simultaneously
    • Depth profiling: Unmatched dynamic range and detection limits from nm to um
    • Gas cluster ion source for best resolution in organic depth profiling
    • 3D analysis: Don't miss anything - Retrospective Analysis
    • Hybrid SIMS: TOF MS/MS with the highest mass resolution (>240,000) and highest mass accuracy (<1 ppm) for molecular structure elucidation
    • SIMS/SFM hybrid: true 3D chemical analysis
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