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Jiangsu VPTek Semiconductor AOI Equipment Co., Ltd.

Changzhou,  Jiangsu Province 
China
http://www.vptek.com
  • Booth: 4133

VPTek is semiconductor wafer and mask AOI tool manufacturer.

Overview

VPTek is professional semiconductor AOI equipment manufacturer. VPTek’s wafer AOI is used to inspect 2D particle/scratch/die lose/edge crack/graph defects and 3D Bump CD control in wafer manufacturing and IC packaging factories. VPTek’s photo mask AOI is used to examine defects in mask blanks and support die to DB/ die to die/ starlight inspection mode for finished photo masks. VPTek already replaced KLA 351/ Camtek Eagle models at customer side.


  Products

  • Tornado series Wafer Defect Inspection AOI
    Camtek replacement Wafer Defect Inspection AOI, used for 2D and 3D inspection in font end, middle end and back end in wafer manufacturing process. Currently our equipment are used in RF SAW chip, MEMS, advanced packaging and so on....

  • Key features:

    Compatible with 4, 6, 8 inch wafer, flexible and convenient

    Double port circulation feeding and unloading, reduce operator waiting time

    Dual optical path line array + area array imaging system, fast scanning

    Support bright field + dark field lighting mode

    Multiple focus modes are fitted based on hardware, software

    Support multi-ROI and multi-layer partition inspection

    Support D2D, D2G, and D2DB inspection mechanisms

    Support AI defect identification and defect classification

  • Tornado series Wafer CD/Overlay Metrology AOI
    Muetec replacement Photomask and Wafer CD/Overlay Metrology AOI, used for CD and Overlay automatic metrology in wafer and photomask manufacturing....

  • Key features:

    Compatible with 4, 6, 8 inch Wafer, flexible and convenient

    Double port circulation feeding and unloading, reduce operator waiting time

    Support manual measurement and recipe based automatic measurement

    Support white, RGB and other wavelength lighting sources

    Support a variety of edge extraction algorithms

  • Storm 3000 series Reticle Defect Inspection AOI
    KLA 351/303 replacement Reticle Defect Inspection AOI, used in maskshop and FAB for mask pattern defect and particle inspection, suitable for 180/130nm process node....

  • Key features:

    Ultra-high resolution optical system, high NA value UV lens, multi-zoom tube, UV laser lighting 

    Support Die2DB/SL/Die2Die inspection mode

    Support SMIF pod automatic box opening and automatic loading and unloading

    High precision air float platform and piezoelectric Z axis are adopted to ensure fast and stable scanning of high-magnification lens 

    Support simultaneous inspection of reflected light and transmitted light

    Support OPC calibration

    Support GPU distributed computing

  • Storm series TFT Mask/Blank Defect Inspection AOI
    Lasertec replacement TFT Mask/Blank Defect Inspection AOI, used for TFT Mask and Blank surface defect inspection....

  • Key features:

    Support a maximum size of 8.5 generation TFT masks

    Support automatic loading and unloading, and interconnecting with AGV

    Support vertical and horizontal configuration

    Support double optical head scanning greatly improves inspection efficiency

    Support simultaneous inspection of reflected light and transmitted light, can inspect pinholes, particles and scratches

    Support Die2DB, Die2Die inspection mode

  • IRIS 530 series Reticle Particle Inspection AOI
    Horiba replacement IRIS 530 series Reticle Particle Inspection AOI, used for Maskshop, FAB to inspect and monitor surface particles during reticle delivery and use....

  • Key features:

    Inspect quartz and pellicle surface particle simultaneously

    Compatible with RSP200, Nikon case, crystal box, automatic opening&loading

    Inspection based on dark field

    Real-time focusing technology based on hardware

    Air bath wind knife is equipped to clear the surface particles of the mask glass

    The interior of the machine meets ISO Class 2 cleanliness standards

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