Shenzhen Shenkeda Semiconductor Technology Co., LTD.

SKD936H Turret Test Handler (High-temperature Test)

It can be completely configured high speed turret for test & vision handler designed to test. It performs vision inspection and electrical functional test along with optional features such as laser marking, sorting, de-taping and taping depending on requirements, also can support the high-temperature test. The handler also offers a wide selection of packages and a variety of options for both input & output configurations.

Application: 
Test (room temperature + high temperature) and sorting QFN,MSOP,SOT,SOP,SOD,TO, ect. 

Advantages:
1.To provide the high-temperature electrical functional testing technology for automotive/vehicle-grade chips, that to solve the problem of large temperature difference during traditional testing, which ensures stable temperature and improves testing efficiency.

2.Adopting the cooling method of vortex tube, greatly accelerates the cooling time of the product and solves the problem of long cooling time from high temperature to room temperature.

SKD308H Pick&Place TestHandler

It is suitable for multifunctional testing and sorting, to incorporate thermal (Tri-temp), vision, sorting and automation options to meet existing and future IC handling needs.

Application: 
It design to perform the high-throughput pick&place handling of IC components, MSOP, QFN , QFP, SIP, LGA, BGA, CSP, SIM, IPM, IGBT, Memory(3x3-55x55mm), etc.

Advantages:
1.Bilateral Drive Structure Design: high precision, fast speed, long service life.
2.Multi-nozzles Design: each nozzle Z-axis motor is controlled independently, that can support 2x4 pick&place nozzles, and the PickArm is designed in cross-beam structure , with a smooth center of gravity and a stable structure. Mechanical architecture is based on full linear motion technology, with controlled axis acceleration and speed, to guarantee fast and accurate handling.
3.Floating indenter with ball bushing structure: provides higher precision testing and high test yield.
4.Intelligent System: It ensures a fully reliable test of packages in cold, hot or ambient test conditions.