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STAr Technologies, Inc.

Hsinchu City,  Taiwan
http://www.star-quest.com
  • Booth: 3428

Welcome to visit our booth#3428!

Overview

STAr Technologies is established in August of 2000. STAr is the acronym for "Semiconductor Test Architects" and as in the name - we are the architects with leading technologies for semiconductor test solutions and provides intellectual property, software, hardware, consumables, service and expertise to meet the requirements and challenges within the semiconductor and optical device industries. Our expertise extends across parametric electrical tests (E-test), wafer-level and package-level reliability (WLR & PLR), mixed signal tests, assembly and packaging services, probe cards, load boards, test interfaces and sockets, etc.

  Products

  • STAr Magic A200 Probe Station
    200 mm Analytical Probing Solutions...

    • STAr MAGIC A-SERIES probe station caters to both semi-automatic and fully automatic engineering probe stations. It is an affordable and flexible probe station for 150mm or 200mm on-wafer electrical probing tests, providing an engineering system to high volume production with its modular upgrade options.
  • STAr Magic P300e Probe Station
    Advanced 300 mm Analytical Probing Solutions...

    • STAr MAGIC P-SERIES probe station is a high-performance prober station and an excellent tool to perform device characterization, wafer-level reliability qualification, SPICE modeling, or yield enhancement.
  • STAr Sagittarius-SPT
    Automated Silicon Photonics T...

    • ．Characterization/Technology Development

    • Electrical Characterization：Ion, Ioff, Von, Capacitance, Resistance, dielectric constants, leakages, power, etc.
    • Optical Characterization   ：Insertion Loss, Coupling Efficiency, Transmissivity, PD responsivity, Polarization, etc.
    • Electro-Optic Characterization : O-I and I-O efficiency, bandwidths 

    ．WAT/E-tests/Inline PCM

    • All E-tests parameters including process monitor control, device parameter test, statistical process control, etc.
    • Optical components for process control and monitor
  • STAr Pluto Series
    All-in-One Per-Pin SMU Reliability Test System
    ...

    • Next generation reliability test system for PLR/WLR qualification
    • Enhances measurement accuracy and efficiency to meet engineering and production needs
    • Complete HCI/NBTI, GOI/TDDB, HCE & EM all-in-one reliability test qualification capabilities

Categories

208 Equipment, Test
  • Burn-In Systems
  • FPD Test; Measurement; Repair Equipment
  • Functional Test Systems
  • Parametric Test Systems
  • Probe Card Maintenance and Analysis Systems
  • Probing Equipment (incl. Analytical; Circuit; Manual; E-Beam; Optical; Wafer Probers)
  • System on a Chip (SOC); Mixed Signal Test Systems
    • 309 Materials, Test
  • Burn-In Boards; Performance Boards (incl. Low; High Temp and Ceramic)
  • Probe Cards; DUT boards and other probing accessories (incl Ceramic and Special Purpose Probe Cards)
  • Test Sockets; Contactors and Contact accessories
    • 602 Manufacturing Software
  • Test Programs
  • Yield Management; Process Control Software
    • 700 Manufacturing Services
  • Burn-In Service
    • 701 Manufacturing Services or Consulting
  • Test
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