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CAMECA

Gennevilliers,  Hauts-de-Seine 
France
http://www.CAMECA.com
  • Booth: 3131

Categories

203 Equipment, Inspection & Measurement
  • Defect; Particle; Bump; Contamination Detection, Review or Inspection
  • Film Thickness; Thickness; Uniformity Measurement; Ellipsometer
  • Microscopes: Scanning Electron Microscope (SEM); Focused Ion Beam (FIB), Transmission Electron Micr
  • Spectrometers; Fourier Transform Infrared(FTIR); Attenuated Total Reflectance FTIR(ATR-FTIR); Auger
  • Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation
  • X-ray; XRF; 3-D X-Ray; Lexes Systems
    • 205 Equipment, Nanotechnology
  • Equipment, Nanotechnology
    • 206 PV Equipment
  • Inspection and Metrology
    • 208 Equipment, Test
  • Failure Analysis Systems
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