Contact Probes:
Spring contact probes are used to test printed circuit boards, wire harnesses, connectors and other electronic components. We offer a wide range of contact probe varieties for each specific contact-making task, always tailored to the customers' needs.
Probe Cards
Wafer probe cards are used for contacting semiconductor wafers. Our solutions include vertical probe cards, probe cards for pads and copper pillars, probe cards for WLCSP, SiP analog and mixed signal flip chip applications as well as Cantilever probe cards.