Nexustest Pte. Ltd.

Science Park II,  Singapore 
Singapore
http://www.nexustest.sg
  • Booth: L2816

A global supplier providing high-end equipment.

Overview

NEXUSTEST is a global supplier providing high-end instruments and equipment for optical and semiconductor testing.

We design and manufacture a wide range of products to test high speed optical modules, laser diodes, Silicon Photonics wafers, Co-Packaged Optics devices and so on, with the product portfolio including BERT (Bit Error Ratio Tester), DCA (Sampling Oscilloscope), SMU, ATE for optical modules, CoC Burn-In, Die Test system, SiPh Wafer Test system.

In addition, our cutting-edge test systems cover the reliability and production test for both Si and SiC wafers or singulated dies, with the product portfolio including WAT (Wafer Acceptance Test), SiC/GaN WLBl (Wafer Level Burn-In), SiC KGD (Known-Good-Die) Handler, WLR (Wafer Level Reliability) and PLR (Package Level Reliability).


  Products

  • Wafer Level Burn-In System WLBI3810
    WLBI3810 is specifically designed for SiC and GaN wafers, featuring efficient and precise testing capabilities. This system can simultaneously perform HTGB and HTRB burn-in tests on 9 wafers....

  • Highlights
    • Automated loading and unloading
      Fully automated wafer handling minimizes manual intervention, boosting efficiency and accuracy
    • Precise probing
      Delivers ±10μm probe mark repositioning accuracy for reliable testing
    • Comprehensive system features
      Supports map data binding for traceability and testing up to 4224 dies simultaneously
    • Multimode burn-in
      Automatically switches between HTGB and HTRB modes
    • Leakage current monitoring
      Igss and Idss leakage current moitoring
    • Integrated testing functions
      Includes Vth parameter testing for in-depth analysis
    • Exceptional measurement accuracy
      Offers maximum resolution of 0.1nA
      Maximum leakage current accuracy 0.5nA
    • Precise temperature control
      Ensures uniformity within ±3℃, accuracy within 1℃, and resolution of 0.1℃
  • Parallel Parametric Test System WAT6600
    WAT6600 is a high efficiency parallel parametric test system that can quickly perform accurate DC measurements, capacitance measurements, and other high-frequency applications (such as ring oscillator measurements), flash memory tests and so on....

  • Highlights
    • Self-developed
      Self-developed hardware and measurement resources
      Stable supply chain, short lead time
    • High output capability
      Perpin resource providing
      SMU:200V max 1A max, PGU:±40V
    • Configurable Pin number
      Maximum 48 Pin full kelvin
    • High precision
      The accuracy down to 1pA, system leakage current <500fA, Extremely low current measurement
    • SECS/GEM compliance
      Easy integration to customer EAP or factory automation
    • Built-in Maintenance software
      CAL/DIAG/PV Fast troubleshooting and diagnostic of hardware problem, timely guarantee of tester performance
    • Compatible with 48pin
      48pin 230mm-diamter probe card Protect customer investment on probe card, low migration cost to new tester
    • Compatible with mainstream probers
      TEL P8XL/P12/P12XL/Precio XL, TSK UF200/UF3000/UF3000EX, etc.
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