STAr Technologies, Inc.

Hsinchu City,  Taiwan
http://www.star-quest.com
  • Booth: B2646

Welcome to visit our booth#B2646!

Overview

Established in August of 2000, STAr Technologies, as the acronym of STAr - the “Semiconductor Test Architects”, are the architects with leading technologies for semiconductor test solutions and provides intellectual property, software, hardware, consumables, services, and expertise to meet the requirements and challenges within the semiconductor and optical device industries. Our expertise extends across parametric electrical tests(E-test), wafer-level and package-level reliability (WLR & PLR), mixed signal tests, assembly and packaging services, probe cards, load boards, test interfaces and sockets, etc.


  Products

  • STAr Magic-P300e Precision Engineering Prober
    Magic P300e is an excellent tool to perform device characterization, wafer-level reliability qualification, SPICE modeling, yield enhancement, RF measurement, and Silicon Photonics....

  • Equipped with close-loop XYZθ stages to provide extraordinary stepping accuracy across wide temperature range from -60degC to 300degC.
  • STAr Magic-A200e Adaptive Engineering Prober
    Magic A200e is an affordable and flexible probe station for 200mm on-wafer electrical probing tests, providing an engineering system to high volume production with its modular upgrade options....

  • It ensures reliable measurement for precision device characterization, wafer-level reliability, and failure analysis, high speed component wafer sort across a full temperature range of -55degC to 300degC.
  • STAr Sagittarius-SPT Silicon Photonics Test System
    Sagittarius-SPT is an electro-optics/silicon-photonics wafer-level test solution and provides semi-automated for full automation wafer-level test system for characterization and acceptance tests of silicon-photonics devices....

  • This automatic test system enables advanced instruments controls and test methodologies developed for the fiber optic manufacturer and adapted to test demands with a key aspect of wafer-level testing to fast reproduce optical coupling, including probe-position optimization and polarization alignment. 
  • STAr Pluto All-in-One Reliability Test System
    STAr Pluto Series system is an all-in-one reliability tester for both package-level and wafer-level qualification and supports a wide range of configurations to meet industry testing requirements including EM, HCI, NBTI, TDDB, etc....

  • Besides, the Pluto-hiVIP model of Pluto Series is an advanced high-current & high-voltage test system with flexible architecture that can be easily upgraded to a high-capacity system to support multiple applications within one system.
  • STAr RF-AARTS Reliability Test System
    STAr RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus to evaluate reliability and performance degradation....

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  • STAr Mercury Mixed Signal Automated Test Equipment
    STAr Mercury series mixed signal test system is the most cost-effective high performance ATE with precision analog and digital instrumentations integrated into a test head built for DC, AC and mixed signal test....

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