A High-Efficiency VNA-Based Solution from Mvit
In automated testing of RF Front-End Modules (DiFEM), efficiency and cost control remain the industry's biggest challenges.
Traditional solutions rely on multi-port VNAs combined with MIPI boxes, external SMUs, and additional time-domain modules. This not only increases hardware investment but also complicates synchronization and limits multi-site scalability.
Mvit introduces a breakthrough alternative.

Rethinking DiFEM Test Architecture
Our STP8000-D DiFEM Test Platform, built around the self-developed SNA3308 Vector Network Analyzer, integrates:
•RF S-parameter testing
•DC measurement (via integrated PPMU)
•MIPI function control
•Switching time measurement (built-in time-domain analysis)
All within a unified PXIe modular architecture.
The result: a streamlined, high-speed, scalable DiFEM test solution.

Why It's Different
✅ Built-in Switching Time Analysis
No external instruments required — wideband sampling and time-domain measurement are integrated within a single platform.
✅ High-Precision Calibration
Supports SOLT and TRL calibration methods for accurate RF performance verification.
✅ Modular Multi-Site Expansion
PXIe-based architecture supports 1–4 parallel test sites with easy future scalability.
✅ Lower System Complexity
Fewer instruments, simplified synchronization logic, reduced system integration effort.