タカノ products are everywhere around you.
TAKANO provides inspection and metrology for Wafer Level Package!!
We will put whole our product like inspection and metrology systems for Wafer Level Package to the exhibition.
・Inspection and Metrology System for Semiconductor
① [Vi Series] Pattern Inspection ※Demo machine
② [WM Series] Non-Pattern Surface Inspection System [Vi Series]
③[ALTAX] Hi-speed Height Inspection for Bump Height
④ Depth Metrology for TSV/Trench Depth Measurement
⑤ AFM(Atomic Force Microscope)
・Laser System (UV Laser)
Looking forward to seeing you at SEMICON Taiwan 2018.