Tesec Corporation

Tokyo, 
Japan
  • Booth: K2781
  • - 1st Floor



Dear Our Colleagues,





We are pleased to inform you that we, Tesec Corporation, will participate in SEMICON Taiwan 2018 to be held at Taipei Nangang Exhibition Centre in September.  Taking this occasion, we would like to express our cordial welcome and invitation to all of our valued overseas customers and colleagues to this exhibition.





For your information, we will exhibit variety of new products as described below in this exhibition and we would like all of you and your customers to visit our booth to see those new product line-up.





Time:  September 5 (Wed) – 7(Fri) , 2018  10:00 – 17:00



Place:  Taipei Nangang Exhibition Centre



Location and Booth :  Testing Pavilion  #K2781, 1st Floor





Products to be exhibited:




  • 471-TT (Wafer Parallel test system)



Other TESEC product line up:




  • MEMS test handler

  • Film Frame test handler (MAP)

  • Die sorter

  • Gravity handler

  • Discrete tester

  • Temperature test handler

  • LCD driver test handler











Very truly yours, 





 Products

  • 471-TT Multi Parallel Wafer test system
    471-TT Multi Parallel Wafer test system for Discrete Device TESEC developed new test system for Discrete device on Wafer named 471-TT to meet the below requirements....

  • 471-TT   Multi Parallel Wafer test system for Discrete Device

    TESEC developed new test system for Discrete device on Wafer

    named 471-TT to meet the below requirements.

    1. High test speed & High cost performance
    • Multi Device Test on Wafer
    • High speed relay switching time
    1. Reliability
    • Taking over Testing concept from 881-TT/A which has released more than 1000 sets in the market

    General spec
    (1) DUT:                                                            Tr, FET, IGBT, Diode, etc.

    (2) Number of Stations :                                     1

    (3) Scope of Devices :                                         Discrete Devices(3pin, 5pin)         

                                                 Bipolar Tr, MOS-FET,IGBT, Diode , etc.

    (4) Number of  Parallel measurement :                16 devices max

    (5) Maximum Output :                                        2kV/20A

    (6) Relay Switching Time :                                  1ms

    (7) Forcing Time :                                               001μs ~ 9.99 s

    (8) Resolution :                                                   Forcing:3digit                                                                                                                                      Measuring: 4digits

    471-TT  Performance Specifications

     Model

      471-TT

     Devices to test

     Tr, FET, IGBT, Diode etc

     Polarity

     NPN / PNP

     Max Voltage

     2kv

     Max Current

     20A

     Parallel Test

      471-TT/S    

      471-TT/D

                                                                                                                                                                8

    16

     Test Stations

     1 Station

     Test Item

     500

     Sort Item

     250

     Resolution(Bias)

     3 digits

     Resolution(Measure) 

     4 digits

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