The high level of comprehensive automation of all stages of the measurement process provided by the FORMULA® TT3 ATE makes it possible to concentrate on the most important things – the features of operation, and analysis of deviations in the semiconductor devices tested.
The hardware/software, design and metrological solutions realized in the test system ensure highly reliable results, keep the work of test personnel free of routine and errors, and significantly increase operational efficiency when performing measurements and tests at industry facilities.
The FORMULA® TT3 Test System is a universal testing and measuring system designed for comprehensive automated verification of the static parameters of semiconductor devices: field effect and bipolar transistors and IGBTs, diodes, thyristors, voltage regulator diodes, optrons and microassemblies, as well as:
• measuring capacitance: input, cross and output capacitance for field effect transistors and IGBTs;
• measuring charge: gate-drain, gate-source and total charge for field effect transistors and IGBTs;
• measuring individual parameters of passive components (L, C, R).