Tesec Corporation

Tokyo, 
Japan
  • Booth: K2985
  • - 1st Floor

Dear Our Colleagues,

We are pleased to inform you that we, Tesec Corporation, will participate in SEMICON Taiwan 2019 to be held at Taipei Nangang Exhibition Centre in September.  Taking this occasion, we would like to express our cordial welcome and invitation to all of our valued overseas customers and colleagues to this exhibition.

TESEC has a large variety  of  testers  for  power  devices  thus  we  can provide various types of test service. There is a new tester 431-TT witch adopted the VI force/measure. Option units to force Max 8kV and 1200A are available.

For your information, we will exhibit variety of new products as described below in this exhibition and we would like all of you and your customers to visit our booth to see those new product line-up.

Time:  September 18 (Wed) – 20(Fri) , 2019  10:00 – 17:00

Place:  Taipei Nangang Exhibition Centre

Location and Booth :  Testing Pavilion  #K2985, 1st Floor

Products to be exhibited(Panel):

  • 431-TT (Discrete Device Test System)

Other TESEC product line up:

  • MEMS test handler
  • Film Frame test handler (MAP)
  • Die sorter
  • Gravity handler
  • Discrete tester
  • Temperature test handler
  • LCD driver test handler

Very truly yours, 

http://en.tesec.co.jp/products/


 Products

  • 431-TT Discrete Device Test System
    The Model 431-TT is Tesec’s newest DC Parametric Test System which employs a new Architecture with V/I Source Measurement Modules....

  • The 431-TT is designed for Power Device testing and features high-speed test measurement and data capture, parallel device testing and an on-screen Waveform Monitor.
  • 471-TT Wafer Parallel Test System
    The new 471-TT is a DC tester with a new concept that realizes simultaneous measurement of plural chips in the wafer process by utilizing measurement technology which we have been accumulating for many years....

  • We have also succeeded to our high-voltage and current measurement technology as one of our advantages.  By measuring plural chips simultaneously, we can achieve a significant improvement in productivity compared to conventional testers.