Customers provide high quality products and services.
Is a laser detection equipment manufacturing company.
And won the 42nd Japan Prize for Achievement. http://www.nikkan.co.jp/articles/view/00420111
◎ main inspection object: photomask quartz glass, silicon wafer, SiC substrate, sapphire substrate.
◎ Check the contents: particles, scratches, pits, bubbles, crystal defects.
◎ inspection sensitivity: 0.1μmPSL.
We will continue to contribute to the community in the fields of semiconductor and liquid crystal and medical care, thanks to the full use of laser detection technology and the development and production of high precision, high speed and low cost laser defect detection equipment.