National Instruments Corporation

Taipei City, 
Taiwan
  • Booth: K2876
  • - 1st Floor

NI semiconductor test customers report 10X improvement in test times while maintaining measurement and performance requirements. To test smart devices, organizations are transitioning from traditional ATE and box instruments to a platform-based approach. NI's platform-based approach from characterization to production offers cost-optimized, high-performance test solutions for RF and mixed-signal test. Come to NI’s booth to understand more about its uniqueness.